Inventor · disambiguated record
Liang-Choo Hsia
Also filed as: HSIA LIANG C · HSIA LIANG-CHOO
115 granted patents·16 pending applications·1,610 citations·filing 1989–2022
99Inventor score
Files withCHARTERED SEMICONDUCTOR MFG62MOSEL VITELIC INC12GLOBALFOUNDRIES SG PTE LTD10HEFECHIP CORPORATION LTD6IBM5
Top patents by PatentIndex Score
131 records- 0196US7479425B2Method for forming high-K charge storage deviceCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Jan 20, 2009·40 cites·28 claims
- 0295US7271110B2High density plasma and bias RF power process to make stable FSG with less free F and SiN with less H to enhance the FSG/SiN integration reliabilityCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Sep 18, 2007·32 cites·18 claims
- 0394US4932883AElastomeric connectors for electronic packaging and testingIBM·Filed 1989·Granted Jun 12, 1990·109 cites·28 claims
- 0493US7524755B2Entire encapsulation of Cu interconnects using self-aligned CuSiN filmCHARTERED SEMICONDUCTOR MFG·Filed 2006·Granted Apr 28, 2009·37 cites·18 claims
- 0592US7960282B2Method of manufacture an integrated circuit system with through silicon viaGLOBALFOUNDRIES SG PTE LTD·Filed 2009·Granted Jun 14, 2011·29 cites·20 claims
- 0691US7445978B2Method to remove spacer after salicidation to enhance contact etch stop liner stress on MOSCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Nov 4, 2008·22 cites·31 claims
- 0791US5701013AWafer metrology pattern integrating both overlay and critical dimension features for SEM or AFM measurementsMOSEL VILTELIC INC·Filed 1996·Granted Dec 23, 1997·144 cites·18 claims
- 0890US8339449B2Defect monitoring in semiconductor device fabricationLIM BARBARA FONG CHIN·Filed 2009·Granted Dec 25, 2012·84 cites·20 claims
- 0990US8177993B2Apparatus and methods for cleaning and drying of wafersSEAH BOON MENG·Filed 2006·Granted May 15, 2012·28 cites·14 claims
- 1090US7202140B1Method to fabricate Ge and Si devices together for performance enhancementCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Apr 10, 2007·21 cites·20 claims
- 1189US8236688B2Integrated circuit system with through silicon via and method of manufacture thereofYELEHANKA PRADEEP RAMACHANDRAMURTHY·Filed 2011·Granted Aug 7, 2012·12 cites·27 claims
- 1289US6787452B2Use of amorphous carbon as a removable ARC material for dual damascene fabricationCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Sep 7, 2004·51 cites·31 claims
- 1387US7585768B2Combined copper plating method to improve gap fillCHARTERED SEMICONDUCTOR MFG·Filed 2006·Granted Sep 8, 2009·14 cites·12 claims
- 1487US7094669B2Structure and method of liner air gap formationCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted Aug 22, 2006·46 cites·29 claims
- 1586US11139368B2Trench capacitor having improved capacitance and fabrication method thereofHEFECHIP CORPORATION LTD·Filed 2019·Granted Oct 5, 2021·3 cites·10 claims
- 1686US7560199B2Polarizing photolithography systemCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Jul 14, 2009·9 cites·20 claims
- 1786US7256112B2Laser activation of implanted contact plug for memory bitline fabricationCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Aug 14, 2007·15 cites·17 claims
- 1885US8289508B2Defect detection recipe definitionLIM VICTOR SENG KEONG·Filed 2009·Granted Oct 16, 2012·16 cites·19 claims
- 1985US7790617B2Formation of metal silicide layer over copper interconnect for reliability enhancementCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Sep 7, 2010·11 cites·29 claims
- 2085US7710182B2Reliable level shifter of ultra-high voltage device used in low power applicationCHARTERED SEMICONDUCTOR MFG·Filed 2008·Granted May 4, 2010·12 cites·22 claims
- 2185US7084025B2Selective oxide trimming to improve metal T-gate transistorCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted Aug 1, 2006·39 cites·41 claims
- 2284US7256084B2Composite stress spacerCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Aug 14, 2007·12 cites·19 claims
- 2384US6762085B2Method of forming a high performance and low cost CMOS deviceCHARTERED SEMICONDUCTOR MFG·Filed 2002·Granted Jul 13, 2004·36 cites·27 claims
- 2484US6008515AStacked capacitor having improved charge storage capacityMOSEL VITELIC INC·Filed 1998·Granted Dec 28, 1999·48 cites·6 claims
- 2582US7253097B2Integrated circuit system using dual damascene processCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Aug 7, 2007·11 cites·20 claims
- 2682US5843822ADouble-side corrugated cylindrical capacitor structure of high density DRAMsMOSEL VITELIC INC·Filed 1997·Granted Dec 1, 1998·54 cites·22 claims
- 2782US5672243AAntireflection coating for highly reflective photolithographic layers comprising chromium oxide or chromium suboxideMOSEL VITELIC INC·Filed 1995·Granted Sep 30, 1997·56 cites·24 claims
- 2882US5633522ACMOS transistor with two-layer inverse-T tungsten gateIBM·Filed 1996·Granted May 27, 1997·60 cites·12 claims
- 2981US8012839B2Method for fabricating a semiconductor device having an epitaxial channel and transistor having sameGLOBALFOUNDRIES SG PTE LTD·Filed 2008·Granted Sep 6, 2011·8 cites·7 claims
- 3081US7745320B2Method for reducing silicide defects in integrated circuitsCHARTERED SEMICONDUCTOR MFG·Filed 2008·Granted Jun 29, 2010·7 cites·21 claims
- 3180US8058123B2Integrated circuit and method of fabrication thereofLIU JINPING·Filed 2007·Granted Nov 15, 2011·8 cites·24 claims
- 3279US7601607B2Protruded contact and insertion of inter-layer-dielectric material to match damascene hardmask to improve undercut for low-k interconnectsCHARTERED SEMICONDUCTOR MFG·Filed 2006·Granted Oct 13, 2009·8 cites·28 claims
- 3377US8405222B2Integrated circuit system with via and method of manufacture thereofYU HONG·Filed 2010·Granted Mar 26, 2013·5 cites·20 claims
- 3477US7528445B2Wing gate transistor for integrated circuitsCHARTERED SEMICONDUCTOR MFG·Filed 2006·Granted May 5, 2009·6 cites·8 claims
- 3576US11296090B2Semiconductor memory device with buried capacitor and fin-like electrodesHEFECHIP CORPORATION LTD·Filed 2019·Granted Apr 5, 2022·1 cites·13 claims
- 3676US7989338B2Grain boundary blocking for stress migration and electromigration improvement in CU interconnectsGLOBALFOUNDRIES SG PTE LTD·Filed 2005·Granted Aug 2, 2011·8 cites·22 claims
- 3776US7803704B2Reliable interconnectsCHARTERED SEMICONDUCTOR MFG·Filed 2008·Granted Sep 28, 2010·6 cites·20 claims
- 3875US8102054B2Reliable interconnectsZHANG BEI CHAO·Filed 2010·Granted Jan 24, 2012·5 cites·20 claims
- 3975US7338886B2Implantation-less approach to fabricating strained semiconductor on isolation wafersCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Mar 4, 2008·6 cites·25 claims
- 4075US5858867AMethod of making an inverse-T tungsten gateMOSEL VITELIC INC·Filed 1996·Granted Jan 12, 1999·30 cites·20 claims
- 4174US7655388B2Mask and method to pattern chromeless phase lithography contact holeCHARTERED SEMICONDUCTOR MFG·Filed 2005·Granted Feb 2, 2010·4 cites·36 claims
- 4274US7224060B2Integrated circuit with protective moatCHARTERED SEMICONDUCTOR MFG·Filed 2004·Granted May 29, 2007·25 cites·24 claims
- 4374US5827780AAdditive metalization using photosensitive polymer as RIE mask and part of composite insulatorFiled 1996·Granted Oct 27, 1998·43 cites·16 claims
- 4473US8354347B2Method of forming high-k dielectric stop layer for contact hole openingGLOBALFOUNDRIES SG PTE LTD·Filed 2007·Granted Jan 15, 2013·6 cites·29 claims
- 4573US7776699B2Strained channel transistor structure and methodCHARTERED SEMICONDUCTOR MFG·Filed 2008·Granted Aug 17, 2010·3 cites·28 claims
- 4672US9054107B2Reliable interconnect for semiconductor deviceGLOBALFOUNDRIES SG PTE LTD·Filed 2013·Granted Jun 9, 2015·2 cites·20 claims
- 4772US8057968B2Mask and method to pattern chromeless phase lithography contact holeTAN SIA KIM·Filed 2010·Granted Nov 15, 2011·2 cites·25 claims
- 4871US8624329B2Spacer-less low-K dielectric processesLEE YONG MENG·Filed 2009·Granted Jan 7, 2014·5 cites·18 claims
- 4970US5599725AMethod for fabricating a MOS transistor with two-layer inverse-T tungsten gate structureIBM·Filed 1994·Granted Feb 4, 1997·40 cites·11 claims
- 5069US7999325B2Method to remove spacer after salicidation to enhance contact etch stop liner stress on MOSGLOBALFOUNDRIES SG PTE LTD·Filed 2008·Granted Aug 16, 2011·3 cites·20 claims
Showing the top 50 of 131 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →