Inventor · disambiguated record
Libor Novak
Also filed as: NOVAK LIBOR · NOVÁK LIBOR
11 granted patents·9 pending applications·3 citations·filing 2010–2025
79Inventor score
Top patents by PatentIndex Score
20 records- 0168US12228484B2Broad ion beam (BIB) systems for more efficient processing of multiple samplesFEI CO·Filed 2022·Granted Feb 18, 2025·0 cites·19 claims
- 0268US2025321164A1Broad ion beam (bib) systems for more efficient processing of multiple samplesFEI CO·Filed 2025·Application pending·0 cites
- 0362US10134563B2Contactless temperature measurement in a charged particle microscopeFEI CO·Filed 2015·Granted Nov 20, 2018·1 cites·20 claims
- 0460US12183539B2Inert gas sample transfer for beam systemsFEI CO·Filed 2022·Granted Dec 31, 2024·0 cites·20 claims
- 0559US9679741B2Environmental cell for charged particle beam systemNOVAK LIBOR·Filed 2010·Granted Jun 13, 2017·2 cites·40 claims
- 0657US12216029B2Liquid shaping with charged particle beamsFEI CO·Filed 2022·Granted Feb 4, 2025·0 cites·18 claims
- 0757US12165833B2System and methods for automated processing of multiple samples in a BIB systemFEI CO·Filed 2022·Granted Dec 10, 2024·0 cites·20 claims
- 0857US12000789B2Method and system for positioning and transferring a sampleFEI CO·Filed 2021·Granted Jun 4, 2024·0 cites·21 claims
- 0956US12476074B2Charged particle sensors including wide bandgap materialsFEI CO·Filed 2022·Granted Nov 18, 2025·0 cites·20 claims
- 1055US2025308837A1Airless transfer and electrical testing of solid state batteries in scanning electron microscopesFEI CO·Filed 2024·Application pending·0 cites
- 1154US12106931B2Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a Broad Ion Beam (BIB) systemFEI CO·Filed 2022·Granted Oct 1, 2024·0 cites·20 claims
- 1253US12482240B2Method for detecting and classifying objects in road trafficBOSCH GMBH ROBERT·Filed 2021·Granted Nov 25, 2025·0 cites·12 claims
- 1351US11676795B2Charged particle beam device for inspection of a specimen with a plurality of charged particle beamletsFEI CO·Filed 2021·Granted Jun 13, 2023·0 cites·18 claims
- 1449US2025102451A1Secondary electron detector for ion beam systemsFEI CO·Filed 2023·Application pending·0 cites
- 1548US2025108317A1Cryogenic cleaning deviceFEI CO·Filed 2023·Application pending·0 cites
- 1646US2025279259A1Heating assembly for charged particle beam systemFEI CO·Filed 2024·Application pending·0 cites
- 1745US2023420216A1Combined laser and broad ion beam (bib) systems for more efficient processing of multiple samplesFEI CO·Filed 2022·Application pending·0 cites
- 1839US2019278273A1Odometry system and method for tracking traffic lightsBOSCH GMBH ROBERT·Filed 2019·Application pending·0 cites
- 1932US2017103868A1Investigation of high-temperature specimens in a charged particle microscopeFEI CO·Filed 2016·Application pending·0 cites
- 2031US2018053638A1Magnet used with a plasma cleanerFEI CO·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →