Inventor · disambiguated record
Li-Wu Tsao
Also filed as: TSAO LI-WU
6 granted patents·2 pending applications·89 citations·filing 1998–2004
84Inventor score
Files withNANYA TECHNOLOGY CORP4UNITED SILICON INC2NANYA TECHOLOGY CORP1UNITED MICROELECTRONICS CORP1
Top patents by PatentIndex Score
8 records- 0171US6165279AMethod for cleaning a semiconductor waferUNITED SILICON INC·Filed 1998·Granted Dec 26, 2000·42 cites·11 claims
- 0269US6551875B2Method of forming a uniform collar oxide layer over an upper portion of a sidewall of a trench extending into a semiconductor substrateNANYA TECHNOLOGY CORP·Filed 2001·Granted Apr 22, 2003·13 cites·19 claims
- 0366US6852004B2CMP machine dresser and method for detecting the dislodgement of diamonds from the sameNANYA TECHNOLOGY CORP·Filed 2002·Granted Feb 8, 2005·12 cites·15 claims
- 0458US6537872B1Method of fabricating a DRAM cell capacitorNANYA TECHNOLOGY CORP·Filed 2002·Granted Mar 25, 2003·9 cites·12 claims
- 0554US6303467B1Method for manufacturing trench isolationUNITED MICROELECTRONICS CORP·Filed 2000·Granted Oct 16, 2001·8 cites·16 claims
- 0635US2004206453A1CMP machine dresser and method for detecting the dislodgement of diamonds from the sameNANYA TECHOLOGY CORP·Filed 2004·Application pending·0 cites
- 0734US6046061AMethod of inspecting wafer water markUNITED SILICON INC·Filed 1998·Granted Apr 4, 2000·5 cites·18 claims
- 0830US2002110970A1Method of fabricating trench capacitor of a memory cellNANYA TECHNOLOGY CORP·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →