Inventor · disambiguated record
Liangjiang Yu
Also filed as: YU LIANGJIANG
3 granted patents·6 pending applications·0 citations·filing 2019–2024
47Inventor score
Files withASML NETHERLANDS BV9
Top patents by PatentIndex Score
9 records- 0175US2025078478A1Fully automated sem sampling system for e-beam image enhancementASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0274US12230013B2Fully automated SEM sampling system for e-beam image enhancementASML NETHERLANDS BV·Filed 2023·Granted Feb 18, 2025·0 cites·20 claims
- 0356US11769317B2Fully automated SEM sampling system for e-beam image enhancementASML NETHERLANDS BV·Filed 2019·Granted Sep 26, 2023·0 cites·16 claims
- 0454US2025003899A1Method and system of image analysis and critical dimension matching for charged-particle inspection apparatusASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0552US11694312B2Image enhancement for multi-layered structure in charged-particle beam inspectionASML NETHERLANDS BV·Filed 2021·Granted Jul 4, 2023·0 cites·15 claims
- 0649US2024331132A1Method and system for anomaly-based defect inspectionASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0747US2024331115A1Image distortion correction in charged particle inspectionASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0846US2024062362A1Machine learning-based systems and methods for generating synthetic defect images for wafer inspectionASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 0945US2025005739A1Systems and methods for defect detection and defect location identification in a charged particle systemASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →