Inventor · disambiguated record
Lucille A. Giannuzzi
Also filed as: GIANNUZZI LUCILLE A · GIANNUZZI LUCILLE ANN
10 granted patents·1 pending application·100 citations·filing 2000–2022
88Inventor score
Top patents by PatentIndex Score
11 records- 0192US7442924B2Repetitive circumferential milling for sample preparationFEI CO·Filed 2006·Granted Oct 28, 2008·41 cites·31 claims
- 0289US7474419B2Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatusFEI CO·Filed 2006·Granted Jan 6, 2009·23 cites·20 claims
- 0378US8740209B2Method and apparatus for ex-situ lift-out specimen preparationGIANNUZZI LUCILLE A·Filed 2012·Granted Jun 3, 2014·5 cites·12 claims
- 0477US10522324B1Method of producing lift out specimens for teaching, practice, and trainingEXPRESSLO LLC·Filed 2018·Granted Dec 31, 2019·1 cites·10 claims
- 0576US8789826B2Method for ex-situ lift-out specimen preparationEXPRESSLO LLC·Filed 2013·Granted Jul 29, 2014·3 cites·19 claims
- 0669US10801926B2Probe with solid beveled tip and method for using same for specimen extractionEXPRESSLO LLC·Filed 2018·Granted Oct 13, 2020·1 cites·16 claims
- 0766US6519542B1Method of testing an unknown sample with an analytical toolAGERE SYSTEMS INC·Filed 2000·Granted Feb 11, 2003·9 cites·23 claims
- 0866US6519543B1Calibration method for quantitative elemental analysisAGERE SYSTEMS INC·Filed 2000·Granted Feb 11, 2003·11 cites·22 claims
- 0965US11808679B2Method and apparatus for cryogenic and environmental controlled specimen handlingEXPRESSLO LLC·Filed 2022·Granted Nov 7, 2023·0 cites·22 claims
- 1065US6603119B1Calibration method for quantitative elemental analysisAGERE SYSTEMS INC·Filed 2000·Granted Aug 5, 2003·6 cites·23 claims
- 1151US2024149128A1Tennis serve toss training aidSuLu Gurus LLC·Filed 2022·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Lucille A. Giannuzzi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →