Inventor · disambiguated record
Masashi Arayama
Also filed as: ARAYAMA MASASHI
6 granted patents·5 pending applications·19 citations·filing 2000–2018
77Inventor score
Technology areasG06F
Top patents by PatentIndex Score
11 records- 0172US8286117B2Macro layout verification apparatus to detect error when connecting macro terminal in LSI design layoutARAYAMA MASASHI·Filed 2010·Granted Oct 9, 2012·5 cites·1 claims
- 0267US8000951B2Timing analysis method and apparatus for enhancing accuracy of timing analysis and improving work efficiency thereofFUJITSU LTD·Filed 2007·Granted Aug 16, 2011·5 cites·7 claims
- 0363US8539412B2Macro layout verification appartusARAYAMA MASASHI·Filed 2012·Granted Sep 17, 2013·2 cites·2 claims
- 0457US6434728B1Activation path simulation equipment and activation path simulation methodFUJITSU LTD·Filed 2000·Granted Aug 13, 2002·7 cites·15 claims
- 0549US2014157220A1Layout design apparatus and layout design methodARAYAMA MASASHI·Filed 2014·Application pending·0 cites
- 0648US8689167B2Layout design apparatus and layout design methodARAYAMA MASASHI·Filed 2012·Granted Apr 1, 2014·0 cites·6 claims
- 0746US2014337657A1Design support device, design support method, and computer-readable recording medium having stored therein design support programFUJITSU LTD·Filed 2014·Application pending·0 cites
- 0843US2014317586A1Support device, design support method, and computer-readable recording mediumFUJITSU LTD·Filed 2014·Application pending·0 cites
- 0940US7739638B2Circuit analyzing device, circuit analyzing method, program, and computer readable information recording medium considering influence of signal input to peripheral circuit which does not have logical influenceFUJITSU LTD·Filed 2005·Granted Jun 15, 2010·0 cites·7 claims
- 1039US2018210988A1Circuit delay analyzing apparatus, circuit delay analyzing method, and non-transitory computer-readable recording mediumFUJITSU LTD·Filed 2018·Application pending·0 cites
- 1135US2011302548A1Delay library generation device and methodARAYAMA MASASHI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →