Inventor · disambiguated record
Masafumi Asano
Also filed as: ASANO MASAFUMI · MURAOKA HISASHI
41 granted patents·24 pending applications·504 citations·filing 1977–2022
98Inventor score
Files withTOSHIBA KK36ASANO MASAFUMI5TOSHIBA MEMORY CORP4TOKYO SHIBAURA ELECTRIC CO3ASAHI CHEMICAL IND2
Top patents by PatentIndex Score
65 records- 0194US4239661ASurface-treating agent adapted for intermediate products of a semiconductor deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1978·Granted Dec 16, 1980·96 cites·32 claims
- 0292US7396621B2Exposure control method and method of manufacturing a semiconductor deviceTOSHIBA KK·Filed 2007·Granted Jul 8, 2008·13 cites·5 claims
- 0390US8381138B2Simulation model creating method, computer program product, and method of manufacturing a semiconductor deviceTOSHIBA KK·Filed 2012·Granted Feb 19, 2013·8 cites·20 claims
- 0488US7812972B2Reticle, apparatus for monitoring optical system, method for monitoring optical system, and method for manufacturing reticleTOSHIBA KK·Filed 2008·Granted Oct 12, 2010·8 cites·17 claims
- 0588US6701512B2Focus monitoring method, exposure apparatus, and exposure maskTOSHIBA KK·Filed 2002·Granted Mar 2, 2004·43 cites·43 claims
- 0687US6741334B2Exposure method, exposure system and recording mediumTOSHIBA KK·Filed 2001·Granted May 25, 2004·28 cites·14 claims
- 0787US4339340ASurface-treating agent adapted for intermediate products of a semiconductor deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1980·Granted Jul 13, 1982·75 cites·34 claims
- 0885US6667139B2Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2002·Granted Dec 23, 2003·35 cites·20 claims
- 0981US4172005AMethod of etching a semiconductor substrateTOKYO SHIBAURA ELECTRIC CO·Filed 1977·Granted Oct 23, 1979·44 cites·10 claims
- 1080US7742834B2Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the sameTOSHIBA KK·Filed 2007·Granted Jun 22, 2010·11 cites·5 claims
- 1177US9433967B2Pattern inspection method, pattern formation control method, and pattern inspection apparatusTOSHIBA KK·Filed 2014·Granted Sep 6, 2016·3 cites·8 claims
- 1277US7250235B2Focus monitor method and maskTOSHIBA KK·Filed 2004·Granted Jul 31, 2007·15 cites·24 claims
- 1377US6813001B2Exposure method and apparatusTOSHIBA KK·Filed 2002·Granted Nov 2, 2004·20 cites·19 claims
- 1475US8420422B2Pattern forming method, processing method, and processing apparatusASANO MASAFUMI·Filed 2011·Granted Apr 16, 2013·4 cites·3 claims
- 1574US7629550B2System of testing semiconductor devices, a method for testing semiconductor devices, and a method for manufacturing semiconductor devicesTOSHIBA KK·Filed 2006·Granted Dec 8, 2009·6 cites·10 claims
- 1674US7510341B2Temperature calibration method for baking processing apparatus, adjustment method for development processing apparatus, and method of manufacturing semiconductor apparatusTOSHIBA KK·Filed 2004·Granted Mar 31, 2009·14 cites·32 claims
- 1773US7175943B2Reticle set, method for designing a reticle set, exposure monitoring method, inspection method for reticle set and manufacturing method for a semiconductor deviceTOSHIBA KK·Filed 2003·Granted Feb 13, 2007·9 cites·9 claims
- 1872US10040219B2Mold and mold manufacturing methodTOSHIBA MEMORY CORP·Filed 2013·Granted Aug 7, 2018·2 cites·16 claims
- 1972US8871408B2Mask pattern creation method, recording medium, and semiconductor device manufacturing methodTAKEKAWA YOKO·Filed 2012·Granted Oct 28, 2014·3 cites·14 claims
- 2072US7883824B2Method for evaluating lithography apparatus and method for controlling lithography apparatusTOSHIBA KK·Filed 2009·Granted Feb 8, 2011·3 cites·12 claims
- 2171US6866976B2Monitoring method, exposure method, a manufacturing method for a semiconductor device, including an etching method and exposure processing unitTOSHIBA KK·Filed 2003·Granted Mar 15, 2005·14 cites·36 claims
- 2270US7184913B2Testing system, a computer implemented testing method and a method for manufacturing electronic devicesTOSHIBA KK·Filed 2006·Granted Feb 27, 2007·2 cites·4 claims
- 2365US7979154B2Method and system for managing semiconductor manufacturing deviceTOSHIBA KK·Filed 2007·Granted Jul 12, 2011·3 cites·2 claims
- 2465US7655369B2Reticle set, method for designing a reticle set, exposure monitoring method, inspection method for reticle set and manufacturing method for a semiconductor deviceTOSHIBA KK·Filed 2006·Granted Feb 2, 2010·1 cites·7 claims
- 2565US7432021B2Reticle, apparatus for monitoring optical system, method for monitoring optical system, and method for manufacturing reticleTOSHIBA KK·Filed 2004·Granted Oct 7, 2008·6 cites·8 claims
- 2663US8055366B2Simulation model creating method, mask data creating method and semiconductor device manufacturing methodTOSHIBA KK·Filed 2009·Granted Nov 8, 2011·1 cites·20 claims
- 2762US7930123B2Method, apparatus, and computer readable medium for evaluating a sampling inspectionTOSHIBA KK·Filed 2009·Granted Apr 19, 2011·1 cites·15 claims
- 2862US7476473B2Process control method, a method for forming monitor marks, a mask for process control, and a semiconductor device manufacturing methodTOSHIBA KK·Filed 2005·Granted Jan 13, 2009·1 cites·17 claims
- 2962US2021114284A1Imprint method and templateTOSHIBA MEMORY CORP·Filed 2020·Application pending·0 cites
- 3061US7855047B2Reticle set, method for designing a reticle set, exposure monitoring method, inspection method for reticle set and manufacturing method for a semiconductor deviceTOSHIBA KK·Filed 2009·Granted Dec 21, 2010·0 cites·5 claims
- 3160US6919153B2Dose monitoring method and manufacturing method of semiconductor deviceKABUSHIKI KAISAHA TOSHIBA·Filed 2003·Granted Jul 19, 2005·7 cites·18 claims
- 3259US7982155B2System of testing semiconductor devices, a method for testing semiconductor devices, and a method for manufacturing semiconductor devicesTOSHIBA KK·Filed 2009·Granted Jul 19, 2011·2 cites·7 claims
- 3359US5754526AChannel switching method and channel switching controllerFUJITSU LTD·Filed 1996·Granted May 19, 1998·24 cites·18 claims
- 3459US2014346701A1Pattern formation device, method for pattern formation, and program for pattern formationTOSHIBA KK·Filed 2014·Application pending·0 cites
- 3558US2003078799A1Mask trading system and methodFiled 2002·Application pending·0 cites
- 3657US7756656B2Measurement coordinate setting system and methodTOSHIBA KK·Filed 2007·Granted Jul 13, 2010·1 cites·20 claims
- 3756US11106128B2Method for designing mask set, recording medium, template, and method for manufacturing templateKIOXIA CORP·Filed 2018·Granted Aug 31, 2021·0 cites·7 claims
- 3855US7970486B2Method for controlling semiconductor manufacturing apparatus and control system of semiconductor manufacturing apparatusTOSHIBA KK·Filed 2007·Granted Jun 28, 2011·1 cites·12 claims
- 3954US10114284B2Method for designing mask set, recording medium, template, and method for manufacturing templateTOSHIBA MEMORY CORP·Filed 2013·Granted Oct 30, 2018·0 cites·5 claims
- 4053US7103503B2Testing system, a computer implemented testing method and a method for manufacturing electronic devicesTOSHIBA KK·Filed 2006·Granted Sep 5, 2006·0 cites·8 claims
- 4153US2024002123A1Lid material for ptp and ptp bodyASAHI CHEMICAL IND·Filed 2021·Application pending·0 cites
- 4253US2024010409A1Lid material for ptp and ptp bodyASAHI CHEMICAL IND·Filed 2021·Application pending·0 cites
- 4351US2013069278A1Pattern formation device, method for pattern formation, and program for pattern formationKOBAYASHI SACHIKO·Filed 2012·Application pending·0 cites
- 4451US2018264712A1Imprint method and templateTOSHIBA MEMORY CORP·Filed 2017·Application pending·0 cites
- 4551US2011245956A1Method and system for managing semiconductor manufacturing deviceTOSHIBA KK·Filed 2011·Application pending·0 cites
- 4650US2025067664A1Determination method and substrate processing apparatusTOKYO ELECTRON LTD·Filed 2022·Application pending·0 cites
- 4750US2015224702A1Pattern inspection member, pattern inspection method, and pattern inspection apparatusTOSHIBA KK·Filed 2014·Application pending·0 cites
- 4849US2010166289A1Feature-quantity extracting method, designed-circuit-pattern verifying method, and computer program productSATAKE MASAKI·Filed 2009·Application pending·0 cites
- 4948USRE46390EPattern forming method, processing method, and processing apparatusTOSHIBA KK·Filed 2015·Granted May 2, 2017·0 cites·36 claims
- 5046US8722535B2Pattern forming method, mold and data processing methodTOSHIBA KK·Filed 2013·Granted May 13, 2014·0 cites·12 claims
Showing the top 50 of 65 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →