Inventor · disambiguated record
Masahiko Baba
Also filed as: BABA MASAHIKO
12 granted patents·1 pending application·262 citations·filing 1987–2008
93Inventor score
Top patents by PatentIndex Score
13 records- 0178US5170061AMethod of and apparatus for measuring oscillation of the outside diameter of a melt surfaceSHINETSU HANDOTAI KK·Filed 1991·Granted Dec 8, 1992·29 cites·18 claims
- 0277US4794263AApparatus for measuring crystal diameterSHINETSU HANDOTAI KK·Filed 1987·Granted Dec 27, 1988·32 cites·12 claims
- 0375US5240684ACrystal diameter measuring deviceSHINETSU HANDOTAI KK·Filed 1991·Granted Aug 31, 1993·36 cites·3 claims
- 0470US6030451ATwo camera diameter control system with diameter tracking for silicon ingot growthSEH AMERICA INC·Filed 1998·Granted Feb 29, 2000·23 cites·11 claims
- 0570US5138179AMethod of and device for diameter measurement used in automatically controlled crystal growthSHINETSU HANDOTAI KK·Filed 1991·Granted Aug 11, 1992·23 cites·13 claims
- 0665US5183528AMethod of automatic control of growing neck portion of a single crystal by the cz methodSHINETSU HANDOTAI KK·Filed 1991·Granted Feb 2, 1993·27 cites·5 claims
- 0764US6228165B1Method of manufacturing crystal of silicon using an electric potentialSEH AMERICA INC·Filed 1999·Granted May 8, 2001·18 cites·19 claims
- 0861US5089238AMethod of forming a temperature pattern of heater and silicon single crystal growth control apparatus using the temperature patternSHINETSU HANDOTAI KK·Filed 1990·Granted Feb 18, 1992·22 cites·8 claims
- 0956US5129986AMethod for controlling specific resistance of single crystal and an apparatus thereforSHINETSU HANDOTAI KK·Filed 1990·Granted Jul 14, 1992·18 cites·18 claims
- 1050US5378900ACrystal diameter measuring deviceSHINETSU HANDOTAI KK·Filed 1993·Granted Jan 3, 1995·13 cites·4 claims
- 1149US2008168866A1Method of manufacturing honeycomb structure-body molding dieDENSO CORP·Filed 2008·Application pending·0 cites
- 1248US5269875AMethod of adjusting concentration of oxygen in silicon single crystal and apparatus for use in the methodSHINETSU HANDOTAI KK·Filed 1992·Granted Dec 14, 1993·8 cites·2 claims
- 1345US5584930AMethod for measuring the diameter of a single crystal ingotSHINETSU HANDOTAI KK·Filed 1995·Granted Dec 17, 1996·13 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →