Inventor · disambiguated record
Marion Batz
Also filed as: BATZ MARION
2 granted patents·2 pending applications·8 citations·filing 2015–2025
47Inventor score
Top patents by PatentIndex Score
4 records- 0184US9336983B2Scanning particle microscope and method for determining a position change of a particle beam of the scanning particle microscopeZEISS CARL SMT GMBH·Filed 2015·Granted May 10, 2016·8 cites·20 claims
- 0252US2025183000A1Method of characterizing a fault in a scanning electron microscopeZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0348US2025029808A1Valves for charged particle beam microscope, valve member and charged particle beam microscopeCARL ZEISS MULTISEM GMBH·Filed 2024·Application pending·0 cites
- 0432US11961705B2Method and apparatus for examining a beam of charged particlesHoinkis Elke·Filed 2020·Granted Apr 16, 2024·0 cites·39 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →