Inventor · disambiguated record
Maarten Bischoff
Also filed as: BISCHOFF MAARTEN
7 granted patents·2 pending applications·26 citations·filing 2012–2023
79Inventor score
Technology areasH01J
Top patents by PatentIndex Score
9 records- 0194US10224174B1Transmission charged particle microscope with imaging beam rotationFEI CO·Filed 2017·Granted Mar 5, 2019·18 cites·10 claims
- 0281US12176179B2Method, device and system for reducing off-axial aberration in electron microscopyFEI CO·Filed 2023·Granted Dec 24, 2024·0 cites·11 claims
- 0381US11587759B2Method, device and system for reducing off-axial aberration in electron microscopyFEI CO·Filed 2018·Granted Feb 21, 2023·2 cites·13 claims
- 0479US11817290B2Method, device and system for reducing off-axial aberration in electron microscopyFEI CO·Filed 2023·Granted Nov 14, 2023·0 cites·9 claims
- 0573US8569693B2Distortion free stigmation of a TEMBISCHOFF MAARTEN·Filed 2012·Granted Oct 29, 2013·4 cites·14 claims
- 0663US9029767B2Method for adjusting a stem equipped with an aberration correctorFEI CO·Filed 2012·Granted May 12, 2015·2 cites·9 claims
- 0755US2024120171A1Reduction of power consumption for a charged particle systemFEI CO·Filed 2023·Application pending·0 cites
- 0853US12463009B2Method and system for studying samples using a scanning transmission charged particle microscope with reduced beam induced sample damageFEI CO·Filed 2022·Granted Nov 4, 2025·0 cites·16 claims
- 0953US2024161999A1Laser Thermal Epitaxy in a Charged Particle MicroscopeFEI CO·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →