Inventor · disambiguated record
Maxime Darnon
Also filed as: DARNON MAXIME
20 granted patents·3 pending applications·529 citations·filing 2009–2015
94Inventor score
Files withDARNON MAXIME8CLEVENGER LAWRENCE A6IBM5COMMISSARIAT ENERGIE ATOMIQUE2APPLIED MATERIALS INC1
Top patents by PatentIndex Score
23 records- 0198US8241992B2Method for air gap interconnect integration using photo-patternable low k materialCLEVENGER LAWRENCE A·Filed 2010·Granted Aug 14, 2012·422 cites·18 claims
- 0294US7790601B1Forming interconnects with air gapsIBM·Filed 2009·Granted Sep 7, 2010·26 cites·18 claims
- 0392US8642252B2Methods for fabrication of an air gap-containing interconnect structureCLEVENGER LAWRENCE A·Filed 2010·Granted Feb 4, 2014·13 cites·17 claims
- 0489US7939446B1Process for reversing tone of patterns on integerated circuit and structural process for nanoscale fabricationIBM·Filed 2009·Granted May 10, 2011·16 cites·42 claims
- 0587US10056266B2Method for manufacturing a resistive device for a memory or logic circuitCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2015·Granted Aug 21, 2018·5 cites·20 claims
- 0685US9123652B2Multi-level autolimitating etching methodCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2014·Granted Sep 1, 2015·14 cites·17 claims
- 0785US8952539B2Methods for fabrication of an air gap-containing interconnect structureIBM·Filed 2014·Granted Feb 10, 2015·5 cites·15 claims
- 0883US8475667B2Method of patterning photosensitive material on a substrate containing a latent acid generatorDARNON MAXIME·Filed 2010·Granted Jul 2, 2013·4 cites·20 claims
- 0980US9059249B2Interconnect structures containing a photo-patternable low-k dielectric with a curved sidewall surfaceDARNON MAXIME·Filed 2012·Granted Jun 16, 2015·4 cites·18 claims
- 1079US8828749B2Methodology for evaluation of electrical characteristics of carbon nanotubesDARNON MAXIME·Filed 2012·Granted Sep 9, 2014·4 cites·17 claims
- 1177US8896120B2Structures and methods for air gap integrationCLEVENGER LAWRENCE A·Filed 2010·Granted Nov 25, 2014·4 cites·17 claims
- 1275US10319870B2Photovoltaic module with a controllable infrared protection layerCLEVENGER LAWRENCE A·Filed 2010·Granted Jun 11, 2019·2 cites·9 claims
- 1373US8183694B2Reversing tone of patterns on integrated circuit and nanoscale fabricationCLEVENGER LAWRENCE A·Filed 2011·Granted May 22, 2012·3 cites·42 claims
- 1471US8853856B2Methodology for evaluation of electrical characteristics of carbon nanotubesDARNON MAXIME·Filed 2010·Granted Oct 7, 2014·2 cites·9 claims
- 1570US8956886B2Embedded test structure for trimming process controlAPPLIED MATERIALS INC·Filed 2014·Granted Feb 17, 2015·2 cites·20 claims
- 1663US8546263B2Method of patterning of magnetic tunnel junctionsJOUBERT OLIVIER·Filed 2011·Granted Oct 1, 2013·3 cites·16 claims
- 1757US8637395B2Methods for photo-patternable low-k (PPLK) integration with curing after pattern transferDARNON MAXIME·Filed 2009·Granted Jan 28, 2014·0 cites·24 claims
- 1855US2011020753A1Method for reversing tone of patterns on integrated circuit and patterning sub-lithography trenchesIBM·Filed 2009·Application pending·0 cites
- 1954US8298937B2Interconnect structure fabricated without dry plasma etch processingDARNON MAXIME·Filed 2009·Granted Oct 30, 2012·0 cites·16 claims
- 2051US8629561B2Air gap-containing interconnect structure having photo-patternable low k materialCLEVENGER LAWRENCE A·Filed 2012·Granted Jan 14, 2014·0 cites·20 claims
- 2149US2013009312A1Interconnect structure fabricated without dry plasma etch processingIBM·Filed 2012·Application pending·0 cites
- 2240US8449781B2Selective etch back process for carbon nanotubes intergrationDARNON MAXIME·Filed 2010·Granted May 28, 2013·0 cites·12 claims
- 2338US2013056874A1Protection of intermetal dielectric layers in multilevel wiring structuresDARNON MAXIME·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →