Inventor · disambiguated record
Mark Daniel Eubanks
Also filed as: EUBANKS MARK · EUBANKS MARK DANIEL
9 granted patents·1 pending application·92 citations·filing 2000–2025
89Inventor score
Top patents by PatentIndex Score
10 records- 0196US11769374B2Gaming machines with free play bonus mode presenting only winning outcomesVIDEO GAMING TECH INC·Filed 2022·Granted Sep 26, 2023·8 cites·20 claims
- 0296US11423744B2Gaming machines with free play bonus mode presenting only winning outcomesVIDEO GAMING TECH INC·Filed 2021·Granted Aug 23, 2022·12 cites·20 claims
- 0396US11043075B2Gaming machines with free play bonus mode presenting only winning outcomesVIDEO GAMING TECH INC·Filed 2020·Granted Jun 22, 2021·12 cites·20 claims
- 0492US12046107B2Gaming machines with free play bonus mode presenting only winning outcomesVIDEO GAMING TECH INC·Filed 2023·Granted Jul 23, 2024·2 cites·20 claims
- 0586US2025349188A1Gaming machines with free play bonus mode presenting only winning outcomesVIDEO GAMING TECH INC·Filed 2025·Application pending·0 cites
- 0685US10614666B2Gaming machines with free play bonus mode presenting only winning outcomesEUBANKS MARK DANIEL·Filed 2011·Granted Apr 7, 2020·13 cites·23 claims
- 0781US12387567B2Gaming machines with free play bonus mode presenting only winning outcomesVIDEO GAMING TECH INC·Filed 2024·Granted Aug 12, 2025·0 cites·20 claims
- 0881US6404250B1On-chip circuits for high speed memory testing with a slow memory testerINFINEON TECHNOLOGIES RICHMOND·Filed 2001·Granted Jun 11, 2002·36 cites·16 claims
- 0966US11043074B2Gaming machines with free play bonus mode presenting only winning outcomesVIDEO GAMING TECH INC·Filed 2020·Granted Jun 22, 2021·0 cites·20 claims
- 1056US6477095B2Method for reading semiconductor die information in a parallel test and burn-in systemINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Nov 5, 2002·9 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →