Inventor · disambiguated record
Masaru Goishi
Also filed as: GOISHI MASARU
16 granted patents·2 pending applications·70 citations·filing 1997–2011
90Inventor score
Top patents by PatentIndex Score
18 records- 0182US8666691B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2011·Granted Mar 4, 2014·8 cites·20 claims
- 0275US8362791B2Test apparatus additional module and test methodADVANTEST CORP·Filed 2009·Granted Jan 29, 2013·8 cites·18 claims
- 0366US8059547B2Test apparatus and test methodGOISHI MASARU·Filed 2008·Granted Nov 15, 2011·4 cites·10 claims
- 0464US7363566B2Pattern generator and test apparatusADVANTEST CORP·Filed 2005·Granted Apr 22, 2008·6 cites·10 claims
- 0564US6061813AMemory test setADVANTEST CORP·Filed 1997·Granted May 9, 2000·27 cites·5 claims
- 0661US8418011B2Test module and test methodGOISHI MASARU·Filed 2011·Granted Apr 9, 2013·2 cites·9 claims
- 0761US8149721B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2009·Granted Apr 3, 2012·2 cites·6 claims
- 0853US7236903B2Test apparatus and control methodADVANTEST CORP·Filed 2005·Granted Jun 26, 2007·2 cites·9 claims
- 0952US7336714B2Phase adjustment apparatus and semiconductor test apparatusADVANTEST CORP·Filed 2004·Granted Feb 26, 2008·4 cites·4 claims
- 1050US8165027B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2009·Granted Apr 24, 2012·0 cites·17 claims
- 1148US8483073B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2009·Granted Jul 9, 2013·0 cites·13 claims
- 1245US7623984B2Test apparatus and electronic deviceADVANTEST CORP·Filed 2007·Granted Nov 24, 2009·0 cites·6 claims
- 1344US8692566B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2011·Granted Apr 8, 2014·0 cites·16 claims
- 1441US8743702B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2010·Granted Jun 3, 2014·0 cites·8 claims
- 1540US7539592B2Test apparatus and electronic deviceADVANTEST CORP·Filed 2007·Granted May 26, 2009·0 cites·7 claims
- 1638US2008232538A1Test apparatus and electronic deviceADVANTEST CORP·Filed 2007·Application pending·0 cites
- 1737US2012136603A1Test apparatus and debug methodISHIKAWA SHINICHI·Filed 2011·Application pending·0 cites
- 1836US6249533B1Pattern generatorADVANTEST CORP·Filed 1997·Granted Jun 19, 2001·7 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →