Inventor · disambiguated record
Mark Gottfried
Also filed as: ELIASHEVICH IVAN · GOTTFRIED MARK
9 granted patents·4 pending applications·331 citations·filing 1998–2010
91Inventor score
Top patents by PatentIndex Score
13 records- 0195US6902990B2Semiconductor device separation using a patterned laser projectionEMCORE CORP·Filed 2002·Granted Jun 7, 2005·77 cites·27 claims
- 0294US6413839B1Semiconductor device separation using a patterned laser projectionEMCORE CORP·Filed 1998·Granted Jul 2, 2002·129 cites·41 claims
- 0393US7863172B2Gallium nitride semiconductor devicePOWER INTEGRATIONS INC·Filed 2008·Granted Jan 4, 2011·27 cites·18 claims
- 0493US6849524B2Semiconductor wafer protection and cleaning for device separation using laser ablationEMCORE CORP·Filed 2002·Granted Feb 1, 2005·56 cites·72 claims
- 0585US7436039B2Gallium nitride semiconductor deviceVELOX SEMICONDUCTOR CORP·Filed 2005·Granted Oct 14, 2008·10 cites·23 claims
- 0684US7439599B2PIN photodiode structure and fabrication process for reducing dielectric delaminationEMCORE CORP·Filed 2005·Granted Oct 21, 2008·10 cites·8 claims
- 0769US7078319B2Laser separated die with tapered sidewalls for improved light extractionGELCORE LLC·Filed 2001·Granted Jul 18, 2006·13 cites·26 claims
- 0853US6727167B2Method of making an aligned electrode on a semiconductor structureEMCORE CORP·Filed 2001·Granted Apr 27, 2004·5 cites·21 claims
- 0950US6946313B2Method of making an aligned electrode on a semiconductor structureEMCORE CORP·Filed 2004·Granted Sep 20, 2005·4 cites·15 claims
- 1046US2011101371A1Gallium nitride semiconductorPOWER INTEGRATIONS INC·Filed 2010·Application pending·0 cites
- 1142US2005003634A1Semiconductor device separation using a patterned laser projectionFiled 2004·Application pending·0 cites
- 1240US2003003690A1Semiconductor device separation using a patterned laser projectionFiled 2002·Application pending·0 cites
- 1337US2006151868A1Package for gallium nitride semiconductor devicesZHU TINGGANG·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →