Inventor · disambiguated record
Masakazu Ichikawa
Also filed as: ICHIKAWA MASAKAZU
16 granted patents·352 citations·filing 1991–2003
95Inventor score
Top patents by PatentIndex Score
16 records- 0192US5416331ASurface atom fabrication method and apparatusHITACHI LTD·Filed 1992·Granted May 16, 1995·69 cites·36 claims
- 0281US5563465AActuatorHITACHI LTD·Filed 1994·Granted Oct 8, 1996·45 cites·16 claims
- 0377US5229607ACombination apparatus having a scanning electron microscope thereinHITACHI LTD·Filed 1991·Granted Jul 20, 1993·47 cites·29 claims
- 0474US5689494ASurface atom fabrication method and apparatusHITACHI LTD·Filed 1995·Granted Nov 18, 1997·22 cites·20 claims
- 0571US5345080AMethod of observing electron microscopic images and an apparatus for carrying out of the sameHITACHI LTD·Filed 1992·Granted Sep 6, 1994·22 cites·34 claims
- 0671US5298747AScanning interference electron microscopyHITACHI LTD·Filed 1991·Granted Mar 29, 1994·23 cites·8 claims
- 0770US5153434AElectron microscope and method for observing microscopic imageHITACHI LTD·Filed 1991·Granted Oct 6, 1992·21 cites·42 claims
- 0868US5144128ASurface microscope and surface microscopyHITACHI LTD·Filed 1991·Granted Sep 1, 1992·29 cites·5 claims
- 0963US7161874B2Power generating type electronic timepieceCITIZEN WATCH CO LTD·Filed 2001·Granted Jan 9, 2007·9 cites·13 claims
- 1055US5973469AMotor driving apparatusCITIZEN WATCH CO LTD·Filed 1997·Granted Oct 26, 1999·18 cites·29 claims
- 1154US6876602B2Electronic timepiece, information processing device, method of displaying charged condition of secondary cell, and computer productCITIZEN WATCH CO LTD·Filed 2003·Granted Apr 5, 2005·4 cites·14 claims
- 1253US6747748B2Manufacturing method for a field-effect transistor, manufacturing method for a semiconductor device, and apparatus thereforTOKYO ELECTRON LTD·Filed 2001·Granted Jun 8, 2004·6 cites·10 claims
- 1350US5746826AMethod and apparatus for forming microstructure bodyHITACHI LTD·Filed 1994·Granted May 5, 1998·20 cites·40 claims
- 1443US5521390ANanodisplacement producing apparatusHITACHI LTD·Filed 1994·Granted May 28, 1996·8 cites·22 claims
- 1537US5940348AElectronic timepieceCITIZEN WATCH CO LTD·Filed 1997·Granted Aug 17, 1999·6 cites·9 claims
- 1632US5572122AApparatus including a specimen tilt mechanism for measuring electromagnetic field distribution in the specimen using a focused electron beamHITACHI LTD·Filed 1993·Granted Nov 5, 1996·3 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →