Inventor · disambiguated record
Masashi Ishibashi
Also filed as: ISHIBASHI MASASHI
5 granted patents·1 pending application·11 citations·filing 2017–2022
74Inventor score
Files withASML NETHERLANDS BV6
Top patents by PatentIndex Score
6 records- 0195US11774862B2Method of obtaining measurements, apparatus for performing a process step, and metrology apparatusASML NETHERLANDS BV·Filed 2021·Granted Oct 3, 2023·4 cites·20 claims
- 0286US11392044B2Method of determining a position of a featureASML NETHERLANDS BV·Filed 2020·Granted Jul 19, 2022·2 cites·26 claims
- 0382US10578980B2Method of determining a position of a featureASML NETHERLANDS BV·Filed 2017·Granted Mar 3, 2020·2 cites·20 claims
- 0477US11175591B2Method of obtaining measurements, apparatus for performing a process step, and metrology apparatusASML NETHERLANDS BV·Filed 2017·Granted Nov 16, 2021·2 cites·24 claims
- 0572US10545410B2Lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program productASML NETHERLANDS BV·Filed 2017·Granted Jan 28, 2020·1 cites·20 claims
- 0642US2024094640A1Method to predict metrology offset of a semiconductor manufacturing processASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →