Inventor · disambiguated record
Masato Iyoki
Also filed as: IYOKI MASATO
18 granted patents·137 citations·filing 1999–2013
93Inventor score
Files withSII NANOTECHNOLOGY INC11IYOKI MASATO3HITACHI HIGH TECH SCIENCE CORP1MARUYAMA KENICHI1SEIKO INSTR INC1
Top patents by PatentIndex Score
18 records- 0191US8024816B2Approach method for probe and sample in scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2010·Granted Sep 20, 2011·13 cites·7 claims
- 0288US7288762B2Fine-adjustment mechanism for scanning probe microscopySII NANOTECHNOLOGY INC·Filed 2005·Granted Oct 30, 2007·14 cites·5 claims
- 0388US7170054B2Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holderSII NANOTECHNOLOGY INC·Filed 2005·Granted Jan 30, 2007·12 cites·14 claims
- 0486US7973942B2Optical displacement detection mechanism and surface information measurement device using the sameSII NANOTECHNOLOGY INC·Filed 2007·Granted Jul 5, 2011·13 cites·14 claims
- 0580US8813261B2Scanning probe microscopeHITACHI HIGH TECH SCIENCE CORP·Filed 2013·Granted Aug 19, 2014·7 cites·20 claims
- 0675US7605368B2Vibration-type cantilever holder and scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2006·Granted Oct 20, 2009·6 cites·25 claims
- 0772US7787133B2Optical displacement-detecting mechanism and probe microscope using the sameSII NANOTECHNOLOGY INC·Filed 2007·Granted Aug 31, 2010·4 cites·13 claims
- 0871US8115367B2Piezoelectric actuator provided with a displacement meter, piezoelectric element, and positioning deviceIYOKI MASATO·Filed 2008·Granted Feb 14, 2012·4 cites·19 claims
- 0971US6257053B1Scanning probe microscope having piezoelectric member for controlling movement of probeSEIKO INSTR INC·Filed 1999·Granted Jul 10, 2001·41 cites·28 claims
- 1066US8214915B2Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantileverSHIGENO MASATSUGU·Filed 2009·Granted Jul 3, 2012·4 cites·32 claims
- 1162US7614288B2Scanning probe microscope fine-movement mechanism and scanning probe microscope using sameSII NANOTECHNOLOGY INC·Filed 2007·Granted Nov 10, 2009·3 cites·20 claims
- 1258US7945965B2Sensor for observations in liquid environments and observation apparatus for use in liquid environmentsSII NANOTECHNOLOGY INC·Filed 2009·Granted May 17, 2011·2 cites·10 claims
- 1358US7241987B2Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probeSII NANOTECHNOLOGY INC·Filed 2005·Granted Jul 10, 2007·6 cites·4 claims
- 1456US8058780B2Circular cylinder type piezoelectric actuator and piezoelectric element and scanning probe microscope using thoseIYOKI MASATO·Filed 2009·Granted Nov 15, 2011·2 cites·11 claims
- 1552US8161568B2Self displacement sensing cantilever and scanning probe microscopeIYOKI MASATO·Filed 2009·Granted Apr 17, 2012·1 cites·20 claims
- 1651US7614287B2Scanning probe microscope displacement detecting mechanism and scanning probe microscope using sameSII NANOTECHNOLOGY INC·Filed 2007·Granted Nov 10, 2009·1 cites·20 claims
- 1748US7282157B2Method of manufacturing light-propagating probe for near-field microscopeSII NANOTECHNOLOGY INC·Filed 2003·Granted Oct 16, 2007·4 cites·52 claims
- 1832US8601608B2Cantilever for scanning probe microscope and scanning probe microscope equipped with itMARUYAMA KENICHI·Filed 2006·Granted Dec 3, 2013·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →