Inventor · disambiguated record
Mark W. Jennion
Also filed as: JENNION MARK W
10 granted patents·284 citations·filing 1995–2005
91Inventor score
Files withUNISYS CORP10
Top patents by PatentIndex Score
10 records- 0182US7139949B1Test apparatus to facilitate building and testing complex computer products with contract manufacturers without proprietary informationUNISYS CORP·Filed 2003·Granted Nov 21, 2006·42 cites·27 claims
- 0276US6882950B1Building and testing complex computer products with contract manufacturers without supplying proprietary informationUNISYS CORP·Filed 2003·Granted Apr 19, 2005·27 cites·24 claims
- 0374US6941243B1Using conversion of high level descriptive hardware language into low level testing language format for building and testing complex computer products with contract manufacturers without proprietary informationUNISYS CORP·Filed 2003·Granted Sep 6, 2005·24 cites·21 claims
- 0472US5778004AVector translatorUNISYS CORP·Filed 1997·Granted Jul 7, 1998·43 cites·5 claims
- 0572US5652524ABuilt-in load board design for performing high resolution quiescent current measurements of a device under testUNISYS CORP·Filed 1995·Granted Jul 29, 1997·42 cites·4 claims
- 0665US6353915B1Methods for evaluating systems of electronic componentsUNISYS CORP·Filed 1999·Granted Mar 5, 2002·50 cites·18 claims
- 0764US5721495ACircuit for measuring quiescent currentUNISYS CORP·Filed 1995·Granted Feb 24, 1998·30 cites·5 claims
- 0862US6530069B2Printed circuit board design, testing, and manufacturing processUNISYS CORP·Filed 2000·Granted Mar 4, 2003·13 cites·9 claims
- 0945US6760904B1Apparatus and methods for translating test vectorsUNISYS CORP·Filed 1999·Granted Jul 6, 2004·13 cites·16 claims
- 1032US7394275B1Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testingUNISYS CORP·Filed 2005·Granted Jul 1, 2008·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →