Inventor · disambiguated record
Masayuki Kawabata
Also filed as: KAWABATA MASAYUKI
19 granted patents·5 pending applications·198 citations·filing 1992–2022
92Inventor score
Files withADVANTEST CORP12KAWABATA MASAYUKI3KURAMOCHI YASUHIDE3HITACHI AUTOMOTIVE SYSTEMS LTD2ISHIDA MASAHIRO2
Top patents by PatentIndex Score
24 records- 0192US6452518B1A-D converting apparatus, and calibration unit and method thereforADVANTEST CORP·Filed 2000·Granted Sep 17, 2002·61 cites·18 claims
- 0279US5537113AA/D or D/A conversion using distribution of differential waveforms to interleaved convertersADVANTEST CORP·Filed 1993·Granted Jul 16, 1996·49 cites·10 claims
- 0376US5241829AMethod of operating heat pumpOSAKA PREFECTURE GOVERNMENT·Filed 1992·Granted Sep 7, 1993·60 cites·4 claims
- 0474US7348913B2Arbitrary waveform generator, arbitrary waveform generate method, testing apparatus, and programADVANTEST CORP·Filed 2006·Granted Mar 25, 2008·7 cites·7 claims
- 0567US11126176B2Vehicle control apparatusHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2017·Granted Sep 21, 2021·1 cites·19 claims
- 0667US8274296B2Test apparatus and electronic device that tests a device under testKAWABATA MASAYUKI·Filed 2009·Granted Sep 25, 2012·5 cites·18 claims
- 0765US12055570B2Measurement apparatus, measurement method and computer readable mediumADVANTEST CORP·Filed 2022·Granted Aug 6, 2024·0 cites·15 claims
- 0859US8068047B2A-D convert apparatus and control methodKURAMOCHI YASUHIDE·Filed 2010·Granted Nov 29, 2011·3 cites·12 claims
- 0957US7778785B2Signal-to-noise ratio measurement for discrete waveformADVANTEST CORP·Filed 2008·Granted Aug 17, 2010·1 cites·17 claims
- 1056US6404371B2Waveform generator and testing deviceADVANTEST CORP·Filed 2001·Granted Jun 11, 2002·4 cites·30 claims
- 1155US8179154B2Device, test apparatus and test methodKURAMOCHI YASUHIDE·Filed 2008·Granted May 15, 2012·2 cites·21 claims
- 1253US7634370B2Waveform input circuit, waveform observation unit and semiconductor test apparatusADVANTEST CORP·Filed 2006·Granted Dec 15, 2009·2 cites·5 claims
- 1348US7982520B2Signal generating apparatus and test apparatusADVANTEST CORP·Filed 2009·Granted Jul 19, 2011·2 cites·18 claims
- 1444US8229706B2Sampling apparatus, sampling method and recording mediumKAWABATA MASAYUKI·Filed 2008·Granted Jul 24, 2012·1 cites·16 claims
- 1543US10700015B2Electronic control unitHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2017·Granted Jun 30, 2020·0 cites·9 claims
- 1642US2014028326A1Da-converter and test apparatusADVANTEST CORP·Filed 2013·Application pending·0 cites
- 1740US7342524B2Waveform generator, waveform shaper, and testing apparatusADVANTEST CORP·Filed 2006·Granted Mar 11, 2008·0 cites·12 claims
- 1840US2012146416A1Test apparatusISHIDA MASAHIRO·Filed 2011·Application pending·0 cites
- 1939US8374813B2Sampling apparatus, sampling method and recording mediumADVANTEST CORP·Filed 2008·Granted Feb 12, 2013·0 cites·11 claims
- 2039US2012112783A1Test apparatusISHIDA MASAHIRO·Filed 2011·Application pending·0 cites
- 2136US8094053B2Signal generating apparatus and test apparatusKURAMOCHI YASUHIDE·Filed 2009·Granted Jan 10, 2012·0 cites·20 claims
- 2236US2012176143A1Sampling apparatus and test apparatusKAWABATA MASAYUKI·Filed 2011·Application pending·0 cites
- 2333US8271222B2Sampling apparatus and sampling methodKANOH EIJI·Filed 2008·Granted Sep 18, 2012·0 cites·19 claims
- 2433US2011181298A1Measurement apparatus and test apparatusADVANTEST CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →