Inventor · disambiguated record
Marleen Kooiman
Also filed as: KOOIMAN MARLEEN
5 granted patents·6 pending applications·3 citations·filing 2018–2025
64Inventor score
Files withASML NETHERLANDS BV11
Top patents by PatentIndex Score
11 records- 0189US12332573B2Method for determining defectiveness of pattern based on after development imageASML NETHERLANDS BV·Filed 2020·Granted Jun 17, 2025·3 cites·15 claims
- 0285US2025355366A1Method for calibrating simulation process based on defect-based process windowASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0367US12386268B2Method for calibrating simulation process based on defect-based process windowASML NETHERLANDS BV·Filed 2021·Granted Aug 12, 2025·0 cites·20 claims
- 0465US2025237967A1Method for determining defectiveness of pattern based on after development imageASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0554US2024257367A1Sem image alignmentASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0650US11966167B2Systems and methods for reducing resist model prediction errorsASML NETHERLANDS BV·Filed 2018·Granted Apr 23, 2024·0 cites·20 claims
- 0749US11435671B2SEM FOV fingerprint in stochastic EPE and placement measurements in large FOV SEM devicesASML NETHERLANDS BV·Filed 2019·Granted Sep 6, 2022·0 cites·20 claims
- 0849US11016399B2Method for controlling a manufacturing apparatus and associated apparatusesASML NETHERLANDS BV·Filed 2018·Granted May 25, 2021·0 cites·20 claims
- 0947US2022382163A1Multi-step process inspection methodASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1043US2024062356A1Data-driven prediction and identification of failure modes based on wafer-level analysis and root cause analysis for semiconductor processingASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1138US2021033978A1Systems and methods for improving resist model predictionsASML NETHERLANDS BV·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →