Inventor · disambiguated record
Masahiko Kuraguchi
Also filed as: KURAGUCHI MASAHIKO
83 granted patents·21 pending applications·283 citations·filing 2006–2025
98Inventor score
Top patents by PatentIndex Score
104 records- 0197US7755108B2Nitride-based semiconductor deviceTOSHIBA KK·Filed 2008·Granted Jul 13, 2010·82 cites·6 claims
- 0296US9818855B2Semiconductor deviceTOSHIBA KK·Filed 2016·Granted Nov 14, 2017·14 cites·21 claims
- 0396US9621153B2Gate control device, semiconductor device, and method for controlling semiconductor deviceTOSHIBA KK·Filed 2015·Granted Apr 11, 2017·16 cites·28 claims
- 0496US7449730B2Nitride-based semiconductor deviceTOSHIBA KK·Filed 2006·Granted Nov 11, 2008·55 cites·5 claims
- 0594US10186588B1Semiconductor substrate and semiconductor deviceTOSHIBA KK·Filed 2018·Granted Jan 22, 2019·12 cites·20 claims
- 0694US9461122B2Semiconductor device and manufacturing method for the sameTOSHIBA KK·Filed 2015·Granted Oct 4, 2016·12 cites·11 claims
- 0793US11563114B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2021·Granted Jan 24, 2023·3 cites·23 claims
- 0892US8698198B2Nitride semiconductor deviceKURAGUCHI MASAHIKO·Filed 2007·Granted Apr 15, 2014·26 cites·8 claims
- 0991US11476336B2Semiconductor deviceTOSHIBA KK·Filed 2020·Granted Oct 18, 2022·3 cites·18 claims
- 1087US11018248B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2019·Granted May 25, 2021·3 cites·19 claims
- 1187US9190508B2GaN based semiconductor deviceTOSHIBA KK·Filed 2014·Granted Nov 17, 2015·7 cites·9 claims
- 1286US11189718B2Semiconductor device with suppressed self-turn-onTOSHIBA KK·Filed 2020·Granted Nov 30, 2021·2 cites·19 claims
- 1385US9837488B2Semiconductor deviceTOSHIBA KK·Filed 2015·Granted Dec 5, 2017·5 cites·16 claims
- 1485US7498618B2Nitride semiconductor deviceTOSHIBA KK·Filed 2006·Granted Mar 3, 2009·13 cites·19 claims
- 1583US2025374586A1Semiconductor deviceTOSHIBA KK·Filed 2025·Application pending·0 cites
- 1681US9349807B2Semiconductor device having GaN-based layerTOSHIBA KK·Filed 2014·Granted May 24, 2016·5 cites·16 claims
- 1778US11088269B2Semiconductor deviceTOSHIBA KK·Filed 2020·Granted Aug 10, 2021·1 cites·16 claims
- 1877US11152480B2Semiconductor deviceTOSHIBA KK·Filed 2020·Granted Oct 19, 2021·1 cites·14 claims
- 1976US12034051B2Nitride-based semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2022·Granted Jul 9, 2024·0 cites·3 claims
- 2076US8368084B2Semiconductor device with capacitor disposed on gate electrodeTOSHIBA KK·Filed 2010·Granted Feb 5, 2013·4 cites·5 claims
- 2175US11967641B2Semiconductor device including different nitride regions improving characteristics of the semiconductor deviceTOSHIBA KK·Filed 2023·Granted Apr 23, 2024·0 cites·20 claims
- 2275US11888040B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2022·Granted Jan 30, 2024·0 cites·9 claims
- 2375US11139393B2Semiconductor device including different nitride regions and method for manufacturing sameTOSHIBA KK·Filed 2019·Granted Oct 5, 2021·1 cites·20 claims
- 2475US10431657B1Semiconductor deviceTOSHIBA KK·Filed 2018·Granted Oct 1, 2019·2 cites·20 claims
- 2574US10373833B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2016·Granted Aug 6, 2019·2 cites·24 claims
- 2674US8963203B2Nitride semiconductor device and method for manufacturing sameTOSHIBA KK·Filed 2013·Granted Feb 24, 2015·3 cites·12 claims
- 2774US2024312780A1Semiconductor device, inspection apparatus of semiconductor device, and method for inspecting semiconductor deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
- 2873US10283633B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2018·Granted May 7, 2019·1 cites·15 claims
- 2973US10109715B2Semiconductor deviceTOSHIBA KK·Filed 2016·Granted Oct 23, 2018·2 cites·13 claims
- 3073US9484421B2Semiconductor deviceTOSHIBA KK·Filed 2015·Granted Nov 1, 2016·2 cites·9 claims
- 3172US11757028B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2021·Granted Sep 12, 2023·0 cites·19 claims
- 3270US11894452B2Semiconductor device, method for manufacturing the same, power circuit, and computerTOSHIBA KK·Filed 2021·Granted Feb 6, 2024·0 cites·12 claims
- 3370US11545553B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2021·Granted Jan 3, 2023·0 cites·9 claims
- 3470US11515411B2Silicon rich nitride layer between a plurality of semiconductor layersTOSHIBA KK·Filed 2021·Granted Nov 29, 2022·0 cites·26 claims
- 3570US10910490B2Semiconductor deviceTOSHIBA KK·Filed 2019·Granted Feb 2, 2021·1 cites·20 claims
- 3670US10453926B2Nitride-based semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2015·Granted Oct 22, 2019·1 cites·4 claims
- 3769US11677020B2Semiconductor device including different nitride regions and method for manufacturing sameTOSHIBA KK·Filed 2021·Granted Jun 13, 2023·0 cites·15 claims
- 3867USRE49962ESemiconductor deviceTOSHIBA KK·Filed 2022·Granted May 7, 2024·0 cites·26 claims
- 3967US9105565B2Nitride semiconductor deviceTOSHIBA KK·Filed 2013·Granted Aug 11, 2015·2 cites·17 claims
- 4067US2023006058A1Semiconductor deviceTOSHIBA KK·Filed 2022·Application pending·0 cites
- 4166US11211463B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2020·Granted Dec 28, 2021·0 cites·14 claims
- 4265US11393904B2Nitride-based semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2019·Granted Jul 19, 2022·0 cites·4 claims
- 4364USRE50471ESemiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2022·Granted Jun 24, 2025·0 cites·20 claims
- 4462US9337300B2Nitride-based semiconductor deviceTOSHIBA KK·Filed 2014·Granted May 10, 2016·1 cites·9 claims
- 4560US2025159920A1Semiconductor deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
- 4660US2025203909A1Semiconductor deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
- 4760US2025169148A1Semiconductor deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
- 4860US2021327711A1Semiconductor device, inspection apparatus of semiconductor device, and method for inspecting semiconductor deviceTOSHIBA KK·Filed 2021·Application pending·0 cites
- 4959US11227942B2Semiconductor device, method for manufacturing the same, power circuit, and computerTOSHIBA KK·Filed 2018·Granted Jan 18, 2022·0 cites·20 claims
- 5059US2025063752A1Semiconductor deviceTOSHIBA KK·Filed 2024·Application pending·0 cites
Showing the top 50 of 104 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →