Inventor · disambiguated record
Mark Meloni
Also filed as: MELONI MARK · MELONI MARK A · MELONI MARK ANTHONY
36 granted patents·7 pending applications·908 citations·filing 1999–2023
97Inventor score
Files withVERITY INSTR INC14SPEEDFAM IPEC CORP9LUTRONIC VISION INC4EMPIRE TECHNOLOGY DEV LLC3MELONI MARK ANTHONY3
Top patents by PatentIndex Score
43 records- 0198US6991514B1Optical closed-loop control system for a CMP apparatus and method of manufacture thereofVERITY INSTR INC·Filed 2003·Granted Jan 31, 2006·174 cites·42 claims
- 0296US10002215B2Arrayed imaging systems having improved alignment and associated methodsOMNIVISION TECH INC·Filed 2016·Granted Jun 19, 2018·117 cites·16 claims
- 0396US9418193B2Arrayed imaging systems having improved alignment and associated methodsOMNIVISION TECH INC·Filed 2013·Granted Aug 16, 2016·128 cites·24 claims
- 0496US8599301B2Arrayed imaging systems having improved alignment and associated methodsDOWSKI JR EDWARD R·Filed 2007·Granted Dec 3, 2013·150 cites·66 claims
- 0595US7339682B2Heterodyne reflectometer for film thickness monitoring and method for implementingVERITY INSTR INC·Filed 2005·Granted Mar 4, 2008·47 cites·62 claims
- 0693US6264532B1Ultrasonic methods and apparatus for the in-situ detection of workpiece lossSPEEDFAM IPEC CORP·Filed 2000·Granted Jul 24, 2001·45 cites·11 claims
- 0791US6685537B1Polishing pad window for a chemical mechanical polishing toolSPEEDFAM IPEC CORP·Filed 2000·Granted Feb 3, 2004·56 cites·28 claims
- 0885US6466642B1Methods and apparatus for the in-situ measurement of CMP process endpointSPEEDFAM IPEC CORP·Filed 2000·Granted Oct 15, 2002·27 cites·15 claims
- 0984US10925767B2Laser doppler vibrometry for eye surface vibration measurement to determine cell damageLUTRONIC VISION INC·Filed 2018·Granted Feb 23, 2021·2 cites·20 claims
- 1083US10365212B2System and method for calibration of optical signals in semiconductor process systemsVERITY INSTR INC·Filed 2017·Granted Jul 30, 2019·5 cites·27 claims
- 1183US8582115B2Tunable and switchable multilayer optical devicesGAO LU·Filed 2010·Granted Nov 12, 2013·4 cites·26 claims
- 1282US10679832B2Microwave plasma sourceVERITY INSTR INC·Filed 2018·Granted Jun 9, 2020·3 cites·23 claims
- 1382US6290584B1Workpiece carrier with segmented and floating retaining elementsSPEEDFAM IPEC CORP·Filed 1999·Granted Sep 18, 2001·58 cites·10 claims
- 1478US11424115B2Multimode configurable spectrometerVERITY INSTR INC·Filed 2018·Granted Aug 23, 2022·2 cites·42 claims
- 1578US8572831B2Disassembling an item by means of RF energyKRUGLICK EZEKIEL·Filed 2010·Granted Nov 5, 2013·4 cites·14 claims
- 1678US8366874B2Removing and segregating components from printed circuit boardsEMPIRE TECHNOLOGY DEV LLC·Filed 2010·Granted Feb 5, 2013·5 cites·12 claims
- 1778US6960115B2Multiprobe detection system for chemical-mechanical planarization toolSPEEDFAM IPEC CORP·Filed 2003·Granted Nov 1, 2005·19 cites·24 claims
- 1877US11690511B2Polarization filtering for improved eye imagingLUTRONIC VISION INC·Filed 2017·Granted Jul 4, 2023·2 cites·13 claims
- 1977US9310250B1High dynamic range measurement system for process monitoringVERITY INSTR INC·Filed 2015·Granted Apr 12, 2016·2 cites·23 claims
- 2077US8780211B2Optical alignment structures and associated methodsOMNIVISION TECH INC·Filed 2013·Granted Jul 15, 2014·1 cites·3 claims
- 2176US6805613B1Multiprobe detection system for chemical-mechanical planarization toolSPEEDFAM IPEC CORP·Filed 2000·Granted Oct 19, 2004·17 cites·29 claims
- 2274US7589843B2Self referencing heterodyne reflectometer and method for implementingVERITY INSTR INC·Filed 2006·Granted Sep 15, 2009·8 cites·33 claims
- 2368US12449622B2Fiberoptical cable assemblies and interfaces for spectrometersVERITY INSTR INC·Filed 2023·Granted Oct 21, 2025·0 cites·30 claims
- 2468US8807189B2Removing and segregating components from printed circuit boardsEMPIRE TECHNOLOGY DEV LLC·Filed 2012·Granted Aug 19, 2014·2 cites·15 claims
- 2567US9383323B2Workpiece characterization systemMELONI MARK ANTHONY·Filed 2011·Granted Jul 5, 2016·2 cites·20 claims
- 2660US2025118603A1Improved optical access for spectroscopic monitoring of semiconductor processesVERITY INSTR INC·Filed 2023·Application pending·0 cites
- 2759US6287171B1System and method for detecting CMP endpoint via direct chemical monitoring of reactionsSPEEDFAM IPEC CORP·Filed 2000·Granted Sep 11, 2001·7 cites·12 claims
- 2859US2022406586A1Multimode configurable spectrometerVERITY INSTR INC·Filed 2022·Application pending·0 cites
- 2954US9801265B2High dynamic range measurement system for process monitoringVERITY INSTR INC·Filed 2016·Granted Oct 24, 2017·0 cites·17 claims
- 3054US9266201B2System to facilitate disassembly of componentsEMPIRE TECHNOLOGY DEV LLC·Filed 2013·Granted Feb 23, 2016·0 cites·16 claims
- 3153US8477195B2Optical alignment structures and associated methodsBARNES IV GEORGE C·Filed 2010·Granted Jul 2, 2013·0 cites·6 claims
- 3251US10794763B2Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a waferVERITY INSTR INC·Filed 2020·Granted Oct 6, 2020·0 cites·20 claims
- 3351US6273792B1Method and apparatus for in-situ measurement of workpiece displacement during chemical mechanical polishingSPEEDFAM IPEC CORP·Filed 1999·Granted Aug 14, 2001·14 cites·6 claims
- 3450US10923324B2Microwave plasma sourceVERITY INSTR INC·Filed 2019·Granted Feb 16, 2021·0 cites·26 claims
- 3549US10925482B2Systems and methods for measuring postlens tear film thicknessLUTRONIC VISION INC·Filed 2018·Granted Feb 23, 2021·0 cites·20 claims
- 3648US12178751B2Laser ophthalmic treatment system with time-gated image capture component and electronic displayLUTRONIC VISION INC·Filed 2018·Granted Dec 31, 2024·0 cites·15 claims
- 3748US2016131587A1Method and Apparatus for Monitoring Pulsed Plasma ProcessesVERITY INSTR INC·Filed 2014·Application pending·0 cites
- 3839US6283836B1Non-abrasive conditioning for polishing padsSPEEDFAM IPEC CORP·Filed 1999·Granted Sep 4, 2001·7 cites·20 claims
- 3939US2012326054A1In Situ Photoluminescence Characterization System and MethodMELONI MARK ANTHONY·Filed 2012·Application pending·0 cites
- 4037US2012120387A1Workpiece Characterization SystemMELONI MARK ANTHONY·Filed 2011·Application pending·0 cites
- 4136US2013016344A1Method and Apparatus for Measuring Process Parameters of a Plasma Etch ProcessBULLOCK LARRY·Filed 2011·Application pending·0 cites
- 4233US2002191197A1Method and apparatus for optical multi-angle endpoint detection during chemical mechanical planarizationFiled 2001·Application pending·0 cites
- 4332US9772226B2Referenced and stabilized optical measurement systemCORLESS JOHN DOUGLAS·Filed 2011·Granted Sep 26, 2017·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →