Inventor · disambiguated record
Masato Naka
Also filed as: NAKA MASATO
7 granted patents·2 pending applications·5 citations·filing 2012–2021
71Inventor score
Top patents by PatentIndex Score
9 records- 0180US10096100B2Inspection device, inspection method, and image processing programTOSHIBA MEMORY CORP·Filed 2016·Granted Oct 9, 2018·5 cites·17 claims
- 0252US9728374B2Inspection apparatusEBARA CORP·Filed 2016·Granted Aug 8, 2017·0 cites·5 claims
- 0350US9368322B2Inspection apparatusEBARA CORP·Filed 2015·Granted Jun 14, 2016·0 cites·4 claims
- 0450US2022035243A1Original plate manufacturing method, drawing data creation method, and pattern defect repairing methodKIOXIA CORP·Filed 2021·Application pending·0 cites
- 0547US8669522B2Mask inspection apparatus and mask inspection methodYAMAGUCHI SHINJI·Filed 2012·Granted Mar 11, 2014·0 cites·19 claims
- 0645US11978195B2Inspection method and inspection apparatusKIOXIA CORP·Filed 2021·Granted May 7, 2024·0 cites·16 claims
- 0735US10586322B2Method for detecting coordinates, coordinate output device and defect inspection deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Mar 10, 2020·0 cites·11 claims
- 0835US10486203B2Substrate production method, substrate processing apparatus, and substrate production systemTOSHIBA MEMORY CORP·Filed 2016·Granted Nov 26, 2019·0 cites·21 claims
- 0931US2016266058A1Reflective Photomask, Method for Inspecting Same and Mask BlankTOSHIBA KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →