Inventor · disambiguated record
Masaaki Namba
Also filed as: NAMBA MASAAKI
6 granted patents·3 pending applications·108 citations·filing 2000–2008
84Inventor score
Top patents by PatentIndex Score
9 records- 0193US6696849B2Fabrication method of semiconductor integrated circuit device and its testing apparatusRENESAS TECH CORP·Filed 2001·Granted Feb 24, 2004·75 cites·6 claims
- 0278US7356742B2Method and apparatus for testing a memory device in quasi-operating conditionsRENESAS TECH CORP·Filed 2005·Granted Apr 8, 2008·12 cites·13 claims
- 0368US6864568B2Packaging device for holding a plurality of semiconductor devices to be inspectedRENESAS TECH CORP·Filed 2002·Granted Mar 8, 2005·10 cites·16 claims
- 0458US7422914B2Fabrication method of semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2007·Granted Sep 9, 2008·3 cites·3 claims
- 0555US6465264B1Method for producing semiconductor device and apparatus usable thereinHITACHI LTD·Filed 2000·Granted Oct 15, 2002·4 cites·15 claims
- 0646US7306957B2Fabrication method of semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2004·Granted Dec 11, 2007·4 cites·9 claims
- 0741US2004135593A1Fabrication method of semiconductor integrated circuit device and its testing apparatusFiled 2004·Application pending·0 cites
- 0839US2008293167A1Fabrication method of semiconductor integrated circuit deviceWADA YUJI·Filed 2008·Application pending·0 cites
- 0929US2002046374A1Method of testing memory device, method of manufacturing memory device, apparatus for testing memory device, method of testing memory module, method of manufacturing memory module, apparatus for testing memory module and method of manufacturing computerFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →