Inventor · disambiguated record
Mark W. Nightingale
Also filed as: NIGHTINGALE MARK · NIGHTINGALE MARK W
23 granted patents·1 pending application·450 citations·filing 1990–2006
96Inventor score
Top patents by PatentIndex Score
24 records- 0190US6402565B1Electronic interconnect device for high speed signal and data transmissionTEKTRONIX INC·Filed 2000·Granted Jun 11, 2002·50 cites·38 claims
- 0289US6400167B1Probe tip adapter for a measurement probeTEKTRONIX INC·Filed 2000·Granted Jun 4, 2002·45 cites·20 claims
- 0388US6603297B1Probe tip adapter for a measurement probeTEKTRONIX INC·Filed 2000·Granted Aug 5, 2003·39 cites·22 claims
- 0488US6404215B1Variable spacing probe tip adapter for a measurement probeTEKTRONIX INC·Filed 2000·Granted Jun 11, 2002·48 cites·4 claims
- 0586US6466000B1Replaceable probe tip holder and measurement probe headTEKTRONIX INC·Filed 2000·Granted Oct 15, 2002·35 cites·35 claims
- 0681US6175080B1Strain relief, pull-strength termination with controlled impedance for an electrical cableTEKTRONIX INC·Filed 1999·Granted Jan 16, 2001·41 cites·10 claims
- 0770US7362112B2Signal acquisition probe having a retractable double cushioned probing tip assemblyTEKTRONIX INC·Filed 2005·Granted Apr 22, 2008·6 cites·18 claims
- 0870US6191594B1Adapter for a measurement test probeTEKTRONIX INC·Filed 1996·Granted Feb 20, 2001·34 cites·13 claims
- 0968US6459287B1Attachable/detachable probing pointTEKTRONIX INC·Filed 2001·Granted Oct 1, 2002·17 cites·16 claims
- 1066US8067718B2Method and apparatus for probingNORDSTROM ROBERT A·Filed 2006·Granted Nov 29, 2011·7 cites·10 claims
- 1165USD344681SHead assembly for a switchable electrical test probeTEKTRONIX INC·Filed 1992·Granted Mar 1, 1994·12 cites·1 claims
- 1264US5387872APositioning aid for a hand-held electrical test probeTEKTRONIX INC·Filed 1993·Granted Feb 7, 1995·24 cites·4 claims
- 1361USD354923SProbing head for an electrical test probeTEKTRONIX INC·Filed 1994·Granted Jan 31, 1995·10 cites·1 claims
- 1459US5061892AElectrical test probe having integral strain relief and ground connectionTEKTRONIX INC·Filed 1990·Granted Oct 29, 1991·23 cites·3 claims
- 1557USD334147SElectrical test probeTEKTRONIX INC·Filed 1990·Granted Mar 23, 1993·9 cites·1 claims
- 1656US6659812B2Surface mount probe point socket and systemTEKTRONIX INC·Filed 2002·Granted Dec 9, 2003·7 cites·16 claims
- 1750US6614221B2Deskew fixtureTEKTRONIX INC·Filed 2002·Granted Sep 2, 2003·6 cites·30 claims
- 1849USD346338SElectrical test probeTEKTRONIX INC·Filed 1993·Granted Apr 26, 1994·6 cites·1 claims
- 1948USD346122SProbing head for an electrical test probeTEKTRONIX INC·Filed 1993·Granted Apr 19, 1994·6 cites·1 claims
- 2047US6989492B2Inverted strain reliefTEKTRONIX INC·Filed 2004·Granted Jan 24, 2006·3 cites·10 claims
- 2146US6600330B1Probe head holderTEKTRONIX INC·Filed 2002·Granted Jul 29, 2003·3 cites·17 claims
- 2243US5220274ASurface mounted electrical switch and probe structureTEKTRONIX INC·Filed 1992·Granted Jun 15, 1993·10 cites·19 claims
- 2342US6218826B1Measurement probe having an internal alignment fixtureTEKTRONIX INC·Filed 1999·Granted Apr 17, 2001·9 cites·3 claims
- 2439US2006267605A1Differential measurement probe having a ground clip system for the probing tipsYANG KEI-WEAN C·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →