USD346122SExpiredUtility

Probing head for an electrical test probe

Assignee: TEKTRONIX INCPriority: Mar 1, 1993Filed: Mar 1, 1993Granted: Apr 19, 1994
Est. expiryMar 1, 2013(expired)· nominal 20-yr term from priority
48
PatentIndex Score
6
Cited by
4
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a probing head for an electrical test probe, as shown and described.

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