Inventor · disambiguated record
Masafumi Nomura
Also filed as: NOMURA MASAFUMI
34 granted patents·6 pending applications·875 citations·filing 1992–2022
98Inventor score
Top patents by PatentIndex Score
40 records- 0195US9412874B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Aug 9, 2016·10 cites·16 claims
- 0294US9159837B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Oct 13, 2015·15 cites·20 claims
- 0394US5871584AProcessing apparatus and processing methodTOKYO ELECTRON LTD·Filed 1997·Granted Feb 16, 1999·162 cites·15 claims
- 0492US9048324B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Jun 2, 2015·11 cites·15 claims
- 0590US5445699AProcessing apparatus with a gas distributor having back and forth parallel movement relative to a workpiece support surfaceTEL KYUSHU KK·Filed 1993·Granted Aug 29, 1995·92 cites·14 claims
- 0689US6447608B1Spin coating apparatusTOKYO ELECTRON LTD·Filed 2000·Granted Sep 10, 2002·43 cites·10 claims
- 0789US5505781AHydrophobic processing apparatus including a liquid delivery systemTOKYO ELECTRON LTD·Filed 1994·Granted Apr 9, 1996·64 cites·11 claims
- 0888US9799829B2Separation method, light-emitting device, module, and electronic deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Oct 24, 2017·5 cites·14 claims
- 0988US9437594B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Sep 6, 2016·7 cites·17 claims
- 1087US10388875B2Separation method, light-emitting device, module, and electronic deviceSEMICONDUCTOR ENERGY LAB·Filed 2017·Granted Aug 20, 2019·4 cites·14 claims
- 1187US10170599B2Semiconductor device including insulating films with different thicknesses and method for manufacturing the semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Jan 1, 2019·4 cites·18 claims
- 1287US9711652B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Jul 18, 2017·4 cites·14 claims
- 1387US5815762AProcessing apparatus and processing methodTOKYO ELECTRON LTD·Filed 1997·Granted Sep 29, 1998·104 cites·30 claims
- 1486US5965200AProcessing apparatus and processing methodTOKYO ELECTRON LTD·Filed 1997·Granted Oct 12, 1999·73 cites·7 claims
- 1585US10134852B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Nov 20, 2018·4 cites·19 claims
- 1685US9337342B2Semiconductor device and method for manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted May 10, 2016·5 cites·21 claims
- 1785US9054200B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Jun 9, 2015·7 cites·15 claims
- 1884US9793295B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Oct 17, 2017·3 cites·19 claims
- 1984US6306455B1Substrate processing methodTOKYO ELECTRON LTD·Filed 1998·Granted Oct 23, 2001·65 cites·8 claims
- 2081US10141337B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2017·Granted Nov 27, 2018·2 cites·19 claims
- 2180US9966475B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2017·Granted May 8, 2018·2 cites·14 claims
- 2280US6159541ASpin coating processTOKYO ELECTRON LTD·Filed 1998·Granted Dec 12, 2000·50 cites·20 claims
- 2379US9831325B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2016·Granted Nov 28, 2017·2 cites·12 claims
- 2479US9064853B2Semiconductor device and method for manufacturing the sameNOMURA MASAFUMI·Filed 2012·Granted Jun 23, 2015·6 cites·10 claims
- 2571US5681614AHydrophobic treatment method involving delivery of a liquid process agent to a process spaceTOKYO ELECTRON LTD·Filed 1996·Granted Oct 28, 1997·31 cites·14 claims
- 2667US7101646B2Developing method and apparatusTOKYO ELECTRON LTD·Filed 2005·Granted Sep 5, 2006·2 cites·4 claims
- 2767US5249142AIndirect temperature-measurement of films formed on semiconductor wafersTEL KYUSHU KK·Filed 1992·Granted Sep 28, 1993·34 cites·12 claims
- 2866US6635113B2Coating apparatus and coating methodTOKYO ELECTRON LTD·Filed 1999·Granted Oct 21, 2003·31 cites·6 claims
- 2958US6969572B2Developing method and apparatusTOKYO ELECTRON LTD·Filed 2003·Granted Nov 29, 2005·5 cites·7 claims
- 3056US10453927B2Semiconductor device including nitride insulating layer and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2018·Granted Oct 22, 2019·0 cites·18 claims
- 3155US9320111B2Light-emitting deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Apr 19, 2016·0 cites·20 claims
- 3255US2024117592A1Method for recovering posture of work machine, posture recovery system, and posture recovery apparatusNEC CORP·Filed 2022·Application pending·0 cites
- 3354US8995607B2Pulse signal output circuit and shift registerSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Mar 31, 2015·1 cites·19 claims
- 3454US6210147B1Method of and apparatus for shaping fibrous elastic bodyARACO KK·Filed 1998·Granted Apr 3, 2001·27 cites·18 claims
- 3554US2019067486A1Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2018·Application pending·0 cites
- 3653US2023392345A1Control device, control system, and control methodNEC CORP·Filed 2021·Application pending·0 cites
- 3751US7182531B2Developing method and apparatusTOKYO ELECTRON LTD·Filed 2006·Granted Feb 27, 2007·0 cites·2 claims
- 3849US2014001467A1Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2013·Application pending·0 cites
- 3942US2013092929A1Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2012·Application pending·0 cites
- 4037US2018072202A1Vehicle seatTOYOTA BOSHOKU KK·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →