Inventor · disambiguated record
Masayuki Ochi
Also filed as: OCHI MASAYUKI
14 granted patents·1 pending application·23 citations·filing 1997–2011
88Inventor score
Top patents by PatentIndex Score
15 records- 0176US7672799B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 2, 2010·11 cites·17 claims
- 0273US7589833B2Foreign matter inspection apparatus and foreign matter inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 15, 2009·4 cites·18 claims
- 0370US7847927B2Defect inspection method and defect inspection apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Dec 7, 2010·2 cites·7 claims
- 0467US7869025B2Optical inspection method and optical inspection systemHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 11, 2011·3 cites·8 claims
- 0561US7953567B2Defect inspection apparatus and defect inspection methodHITACHI HIGH TECH CORP·Filed 2010·Granted May 31, 2011·2 cites·36 claims
- 0658US7847928B2Inspection device and inspection methodHITACHI HIGH TECH CORP·Filed 2008·Granted Dec 7, 2010·0 cites·16 claims
- 0757US7876431B2Foreign matter inspection apparatus and foreign matter inspection methodHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 25, 2011·0 cites·7 claims
- 0855US8102522B2Inspection apparatus and inspection methodSUGA TADASHI·Filed 2007·Granted Jan 24, 2012·1 cites·11 claims
- 0954US8314930B2Inspection device and inspection methodTANIGUCHI KOICHI·Filed 2010·Granted Nov 20, 2012·0 cites·11 claims
- 1050US8345233B2Inspection apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2011·Granted Jan 1, 2013·0 cites·5 claims
- 1148US8625089B2Foreign matter inspection apparatus and foreign matter inspection methodBAMBA YOSHIO·Filed 2010·Granted Jan 7, 2014·0 cites·16 claims
- 1247US8228496B2Defect inspection method and defect inspection apparatusCHIKAMATSU SHUICHI·Filed 2010·Granted Jul 24, 2012·0 cites·11 claims
- 1347US2011141463A1Defect inspection method, and defect inspection deviceCHIKAMATSU SHUICHI·Filed 2009·Application pending·0 cites
- 1439US8189185B2Optical inspection method and optical inspection systemSOEDA HIDEKI·Filed 2010·Granted May 29, 2012·0 cites·24 claims
- 1528US5864409AImage processing system providing access to data processingCANON KK·Filed 1997·Granted Jan 26, 1999·0 cites·38 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →