Inventor · disambiguated record
Masaki Ogihara
Also filed as: OGIHARA MASAKI
31 granted patents·1 pending application·541 citations·filing 1987–2005
98Inventor score
Top patents by PatentIndex Score
32 records- 0187US7182257B2Distribution management method and systemHITACHI LTD·Filed 2005·Granted Feb 27, 2007·18 cites·22 claims
- 0281US6880753B2Distribution management method and systemHITACHI LTD·Filed 2002·Granted Apr 19, 2005·20 cites·27 claims
- 0375US5079613ASemiconductor device having different impurity concentration wellsTOSHIBA KK·Filed 1990·Granted Jan 7, 1992·37 cites·35 claims
- 0474US5335205ADRAM using word line potential control circuitcircuitTOSHIBA KK·Filed 1991·Granted Aug 2, 1994·27 cites·22 claims
- 0571US5475646AScreening circuitry for a dynamic random access memoryTOSHIBA KK·Filed 1994·Granted Dec 12, 1995·32 cites·20 claims
- 0669US5726475ASemiconductor device having different impurity concentration wellsTOSHIBA KK·Filed 1994·Granted Mar 10, 1998·29 cites·10 claims
- 0769US5386386ARedundancy circuit having a spare memory block replacing defective memory cells in different blocksTOSHIBA KK·Filed 1991·Granted Jan 31, 1995·30 cites·3 claims
- 0869US4980863ASemiconductor memory device having switching circuit for coupling together two pairs of bit linesTOSHIBA KK·Filed 1990·Granted Dec 25, 1990·29 cites·30 claims
- 0965US5586078ADynamic type memoryTOSHIBA KK·Filed 1995·Granted Dec 17, 1996·49 cites·10 claims
- 1063US5712827ADynamic type memoryTOSHIBA KK·Filed 1995·Granted Jan 27, 1998·20 cites·24 claims
- 1163US5559748ASemiconductor integrated circuit allowing change of product specification and chip screening method therewithTOSHIBA KK·Filed 1995·Granted Sep 24, 1996·15 cites·69 claims
- 1263US5374838ASemiconductor device having different impurity concentration wellsTOSHIBA KK·Filed 1992·Granted Dec 20, 1994·19 cites·4 claims
- 1363US5272672ASemiconductor memory device having redundant circuitTOSHIBA KK·Filed 1991·Granted Dec 21, 1993·23 cites·6 claims
- 1462US7190254B2Emigrant reception system, emigrant gate system, emigrant control system, emigrant control method, passport applicant information management method, layout of emigrant gate, immigrant reception system, immigrant gate system, immigrant control system, immigrant control method, layout of immigrant gate system, and passportHITACHI LTD·Filed 2002·Granted Mar 13, 2007·10 cites·4 claims
- 1559US6141288ASemiconductor memory device allowing change of refresh mode and address switching method therewithTOSHIBA KK·Filed 1999·Granted Oct 31, 2000·12 cites·14 claims
- 1659US5303193ASemiconductor deviceTOSHIBA KK·Filed 1991·Granted Apr 12, 1994·19 cites·21 claims
- 1759US5260226ASemiconductor device having different impurity concentration wellsTOSHIBA KK·Filed 1992·Granted Nov 9, 1993·16 cites·5 claims
- 1859US5238860ASemiconductor device having different impurity concentration wellsTOSHIBA KK·Filed 1992·Granted Aug 24, 1993·19 cites·8 claims
- 1958US5420816ASemiconductor memory apparatus with configured word lines to reduce noiseTOSHIBA KK·Filed 1994·Granted May 30, 1995·18 cites·14 claims
- 2058US5144388ASemiconductor device having a plurality of fets formed in an element areaTOSHIBA KK·Filed 1991·Granted Sep 1, 1992·18 cites·46 claims
- 2156US5633827ASemiconductor integrated circuit device allowing change of product specification and chip screening method therewithTOSHIBA KK·Filed 1995·Granted May 27, 1997·10 cites·14 claims
- 2256US5550504ADram using word line potential control circuitTOSHIBA KK·Filed 1994·Granted Aug 27, 1996·13 cites·4 claims
- 2353US5812481ASemiconductor integrated circuit device allowing change of product specification and chip screening method therewithTOSHIBA KK·Filed 1996·Granted Sep 22, 1998·9 cites·57 claims
- 2453US4829483AMethod and apparatus for selecting disconnecting first and second bit line pairs for sensing data output from a drain at a high speedTOSHIBA KK·Filed 1987·Granted May 9, 1989·13 cites·17 claims
- 2548US4931992ASemiconductor memory having barrier transistors connected between sense and restore circuitsTOSHIBA KK·Filed 1989·Granted Jun 5, 1990·10 cites·11 claims
- 2643US5642326ADynamic memoryTOSHIBA KK·Filed 1995·Granted Jun 24, 1997·9 cites·14 claims
- 2742US5371710ASemiconductor memory device having test modeTOSHIBA KK·Filed 1993·Granted Dec 6, 1994·8 cites·31 claims
- 2840USRE37427EDynamic type memoryTOSHIBA KK·Filed 2000·Granted Oct 30, 2001·2 cites·120 claims
- 2940US5619162ADram using word line potential circuit controlTOSHIBA KK·Filed 1996·Granted Apr 8, 1997·5 cites·4 claims
- 3040US2003212467A1Article management method and systemHITACHI LTD·Filed 2003·Application pending·0 cites
- 3131US5111275AMulticell semiconductor memory deviceTOSHIBA KK·Filed 1988·Granted May 5, 1992·2 cites·14 claims
- 3230US5970015ASemiconductor integrated circuit device allowing change of product specification and chip screening method therewithTOSHIBA KK·Filed 1998·Granted Oct 19, 1999·0 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →