Inventor · disambiguated record
Masamichi Oi
Also filed as: OI MASAMICHI
9 granted patents·93 citations·filing 1999–2005
87Inventor score
Top patents by PatentIndex Score
9 records- 0189US7154106B2Composite system of scanning electron microscope and focused ion beamSII NANOTECHNOLOGY INC·Filed 2005·Granted Dec 26, 2006·16 cites·20 claims
- 0276US6825468B2Fine stencil structure correction deviceSII NANOTECHNOLOGY INC·Filed 2003·Granted Nov 30, 2004·12 cites·28 claims
- 0370US6472881B1Liquid metal ion source and method for measuring flow impedance of liquid metal ion sourceSEIKO INSTR INC·Filed 2000·Granted Oct 29, 2002·9 cites·11 claims
- 0467US6452173B1Charged particle apparatusSEIKO INSTR INC·Filed 1999·Granted Sep 17, 2002·21 cites·20 claims
- 0560US6486471B1Composite charge particle beam apparatusSEIKO INSTR INC·Filed 1999·Granted Nov 26, 2002·15 cites·21 claims
- 0658US6452172B1Composite charged particle beam apparatusSEIKO INSTR INC·Filed 1999·Granted Sep 17, 2002·14 cites·19 claims
- 0752US7339383B2Nanogripper device having length measuring function and method for length measurement executed with nanogripper device having length measuring functionAOI ELECTRONICS CO LTD·Filed 2005·Granted Mar 4, 2008·2 cites·20 claims
- 0848US6934920B2Specimen analyzing methodSII NANOTECHNOLOGY INC·Filed 2001·Granted Aug 23, 2005·4 cites·20 claims
- 0938US7060397B2EPL mask processing method and device thereofSII NANOTECHNOLOGY INC·Filed 2003·Granted Jun 13, 2006·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →