Inventor · disambiguated record
Masao Okubo
Also filed as: MIKI MASAYOSHI · OKUBO MASAO
26 granted patents·5 pending applications·945 citations·filing 1976–2019
97Inventor score
Files withNIHON DENSHIZAIRYO KK6SUMITOMO CHEMICAL CO5JAPAN ELECTRONIC MATERIALS4FUJI XEROX CO LTD3HAGIWARA RESEARCH CORP3
Top patents by PatentIndex Score
31 records- 0196US4523144AComplex probe card for testing a semiconductor waferJAPAN ELECTRONIC MATERIALS·Filed 1981·Granted Jun 11, 1985·118 cites·1 claims
- 0293US6853208B2Vertical probe cardNIHON DENSHIZAIRYO KK·Filed 2001·Granted Feb 8, 2005·64 cites·1 claims
- 0393US5670889AProbe card for maintaining the position of a probe in high temperature applicationNIHON DENSHIZAIRYO KK·Filed 1995·Granted Sep 23, 1997·136 cites·13 claims
- 0492US5134365AProbe card in which contact pressure and relative position of each probe end are correctly maintainedNIHON DENSHIZAIRYO KK·Filed 1991·Granted Jul 28, 1992·115 cites·1 claims
- 0591US5244667ASilica-gel based antimicrobial composition having an antimicrobial coat of aluminosilicate on the surface of silica gelHAGIWARA RESEARCH CORP·Filed 1991·Granted Sep 14, 1993·44 cites·2 claims
- 0690US5055778AProbe card in which contact pressure and relative position of each probe end are correctly maintainedNIHON DENSHIZAIRYO KK·Filed 1990·Granted Oct 8, 1991·97 cites·1 claims
- 0788US4518914ATesting apparatus of semiconductor wafersJAPAN ELECTRONIC MATERIALS·Filed 1982·Granted May 21, 1985·61 cites·5 claims
- 0886US5778291AImage forming apparatus having a transfer member positional downstream of a nip portionFUJI XEROX CO LTD·Filed 1996·Granted Jul 7, 1998·41 cites·16 claims
- 0985US4171218AAnticorrosive bellowsSUMITOMO CHEMICAL CO·Filed 1978·Granted Oct 16, 1979·30 cites·3 claims
- 1084US5413789AAntimicrobial composition of aluminosilicate coated silica gelHAGIWARA RESEARCH CORP·Filed 1993·Granted May 9, 1995·29 cites·4 claims
- 1182US6300783B1Probe, manufacture of same, and vertically operative type probe card assembly employing sameNIHON DENSHIZAIRYO KK·Filed 1998·Granted Oct 9, 2001·45 cites·14 claims
- 1273US10437657B2Support system and non-transitory computer readable mediumFUJI XEROX CO LTD·Filed 2017·Granted Oct 8, 2019·2 cites·20 claims
- 1371US6294922B1Probe for testing a semiconductor integrated circuitNIHON DENSHIZAIRYO KK·Filed 1996·Granted Sep 25, 2001·28 cites·19 claims
- 1465US4638217AFused metal ion source with sintered metal headNIPPON DENSHI ZAIRYO KK·Filed 1983·Granted Jan 20, 1987·12 cites·6 claims
- 1565US4279648AHigh silicon chromium nickel steel for strong nitric acidSUMITOMO CHEMICAL CO·Filed 1979·Granted Jul 21, 1981·13 cites·5 claims
- 1665US2009242411A1Polyimide-metal laminated body and polyimide circuit boardUBE INDUSTRIES·Filed 2009·Application pending·0 cites
- 1760US5298252AAntimicrobial composition having resistance to heat and weathersHAGIWARA RESEARCH CORP·Filed 1991·Granted Mar 29, 1994·10 cites·5 claims
- 1860US4774413AIon emmissive head and ion beam irradiation device incorporating the sameNIPPON DENSHI ZAIRYO KK·Filed 1986·Granted Sep 27, 1988·12 cites·2 claims
- 1955US2008286538A1Polyimide-Metal Laminated Body and Polyimide Circuit BoardUBE INDUSTRIES·Filed 2005·Application pending·0 cites
- 2053US5422634ALocking system using a key including an IC memoryZEXEL CORP·Filed 1992·Granted Jun 6, 1995·44 cites·4 claims
- 2149US4585479AWelding material of ferrite-austenite two-phase stainless steel and method of applicationSUMITOMO CHEMICAL CO·Filed 1984·Granted Apr 29, 1986·9 cites·7 claims
- 2248US6013169AMethod of reforming a tip portion of a probeJAPAN ELECTRONIC MATERIALS·Filed 1998·Granted Jan 11, 2000·13 cites·9 claims
- 2348US4381941AMethod for improving surface defect of specific steel resistant to concentrated nitric acidSUMITOMO CHEMICAL CO·Filed 1981·Granted May 3, 1983·4 cites·4 claims
- 2447US11215971B2Support system and non-transitory computer readable mediumFUJIFILM BUSINESS INNOVATION CORP·Filed 2019·Granted Jan 4, 2022·0 cites·13 claims
- 2546US5729799AImage forming method and apparatus having a semiconductive intermediate transfer memberFUJI XEROX CO LTD·Filed 1996·Granted Mar 17, 1998·8 cites·10 claims
- 2641US4659397AManufacturing process for plate or forging of ferrite-austenite two-phase stainless steelNIPPON STAINLESS STEEL CO·Filed 1984·Granted Apr 21, 1987·5 cites·12 claims
- 2737US4115148AMethod for preventing corrosion of a sulfur dioxide regenerating apparatusSUMITOMO CHEMICAL CO·Filed 1976·Granted Sep 19, 1978·5 cites·2 claims
- 2837US2004040739A1Multilayer wiring board and method of manufacturing the sameFiled 2002·Application pending·0 cites
- 2936US6392459B1Gate signal generating circuit, semiconductor evaluation apparatus, and semiconductor evaluating methodMITSUBISHI ELECTRIC CORP·Filed 2000·Granted May 21, 2002·0 cites·10 claims
- 3031US2002153913A1Probe for the probe cardJAPAN ELECTRONIC MATERIALS·Filed 2001·Application pending·0 cites
- 3115US2002028641A1Probe end cleaning sheetFiled 1999·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →