Inventor · disambiguated record
Maurice Peemen
Also filed as: PEEMEN MAURICE
14 granted patents·6 pending applications·6 citations·filing 2018–2025
84Inventor score
Top patents by PatentIndex Score
20 records- 0192US12175648B2Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a methodFEI CO·Filed 2023·Granted Dec 24, 2024·2 cites·22 claims
- 0291US11488800B2Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imagingFEI CO·Filed 2021·Granted Nov 1, 2022·2 cites·20 claims
- 0380US2025201512A1Live-assisted image acquisition method and system with charged particle microscopyFEI CO·Filed 2024·Application pending·0 cites
- 0480US2025378543A1Area selection in charged particle microscope imagingFEI CO·Filed 2025·Application pending·0 cites
- 0575US12288667B2Live-assisted image acquisition method and system with charged particle microscopyFEI CO·Filed 2022·Granted Apr 29, 2025·0 cites·20 claims
- 0674US12136532B2Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imagingFEI CO·Filed 2022·Granted Nov 5, 2024·0 cites·20 claims
- 0769US11151356B2Using convolution neural networks for on-the-fly single particle reconstructionFEI CO·Filed 2019·Granted Oct 19, 2021·2 cites·15 claims
- 0866US12347083B2Area selection in charged particle microscope imagingFEI CO·Filed 2021·Granted Jul 1, 2025·0 cites·21 claims
- 0964US11861817B2Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a methodFEI CO·Filed 2021·Granted Jan 2, 2024·0 cites·20 claims
- 1059US12392735B2Sparse image reconstruction from neighboring tomography tilt imagesFEI CO·Filed 2021·Granted Aug 19, 2025·0 cites·21 claims
- 1159US2024110880A1Dynamic Data Driven Detector Tuning for Improved Investigation of Samples in Charged Particle SystemsFEI CO·Filed 2022·Application pending·0 cites
- 1258US11741730B2Charged particle microscope scan masking for three-dimensional reconstructionFEI CO·Filed 2021·Granted Aug 29, 2023·0 cites·20 claims
- 1355US11569056B2Parameter estimation for metrology of features in an imageFEI CO·Filed 2019·Granted Jan 31, 2023·0 cites·18 claims
- 1455US10903043B2Method, device and system for remote deep learning for microscopic image reconstruction and segmentationFEI CO·Filed 2018·Granted Jan 26, 2021·0 cites·12 claims
- 1551US2025238571A1Digital twin calibrationFEI ELECTRON OPTICS B V·Filed 2024·Application pending·0 cites
- 1650US11100612B2Acquisition strategy for neural network based image restorationFEI CO·Filed 2019·Granted Aug 24, 2021·0 cites·18 claims
- 1749US11355305B2Low keV ion beam image restoration by machine learning for object localizationFEI CO·Filed 2019·Granted Jun 7, 2022·0 cites·20 claims
- 1845US11380529B2Depth reconstruction for 3D images of samples in a charged particle systemFEI CO·Filed 2020·Granted Jul 5, 2022·0 cites·20 claims
- 1943US2024281650A1Deep learning techniques for analyses of experimental data generated by two or more detectorsFEI CO·Filed 2023·Application pending·0 cites
- 2041US2020312611A1Artificial intelligence enabled volume reconstructionFEI CO·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →