Inventor · disambiguated record
Manfred Proll
Also filed as: PROELL MANFRED · PROLL MANFRED
27 granted patents·6 pending applications·276 citations·filing 1987–2007
96Inventor score
Top patents by PatentIndex Score
33 records- 0194US7023701B2Device for cooling memory modulesINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 4, 2006·112 cites·7 claims
- 0284US7196554B2Integrated clock supply chip for a memory module, memory module comprising the integrated clock supply chip, and method for operating the memory module under test conditionsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Mar 27, 2007·47 cites·16 claims
- 0368US7443713B2Integrated semiconductor memory and method for operating a semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 28, 2008·3 cites·22 claims
- 0462US7482644B2Integrated semiconductor memory and method for electrically stressing an integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 27, 2009·5 cites·14 claims
- 0561US7198403B2Arrangement for determining a temperature loading of an integrated circuit and methodINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 3, 2007·8 cites·24 claims
- 0660US7158426B2Method for testing an integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 2, 2007·6 cites·21 claims
- 0758US7266027B2Integrated semiconduct memory with test circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 4, 2007·4 cites·19 claims
- 0858US7196572B2Integrated circuit for stabilizing a voltageINFINEON TECHNOLOGIES AG·Filed 2005·Granted Mar 27, 2007·4 cites·17 claims
- 0958US7180820B2Integrated semiconductor memory comprising at least one word line and comprising a multiplicity of memory cellsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 20, 2007·4 cites·23 claims
- 1058US6781889B2Method for operating a semiconductor memory and semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2002·Granted Aug 24, 2004·12 cites·16 claims
- 1156US4810178AApparatus for molding outer and inner soles onto shoe uppersKLOECKNER FERROMATIK DESMA·Filed 1987·Granted Mar 7, 1989·15 cites·2 claims
- 1253US7102912B2Integrated semiconductor memory device and method for operating an integrated semiconductor memory deviceINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 5, 2006·3 cites·28 claims
- 1353US6927557B2Voltage generator arrangementINFINEON TECHNOLOGIES AG·Filed 2003·Granted Aug 9, 2005·8 cites·11 claims
- 1452US6940775B2Integrated dynamic memory having a control circuit for controlling a refresh mode for memory cellsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 6, 2005·7 cites·9 claims
- 1547US7236412B2Integrated semiconductor memory with redundant memory cells replaceable for either true or complementary defective memory cellsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jun 26, 2007·2 cites·40 claims
- 1646US7085185B2Circuit and method for controlling an access to an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 1, 2006·5 cites·14 claims
- 1746US4960374AApparatus for molding outer and inner soles and a sole welt onto shoe uppersKLOECKNER FERROMATIK DESMA·Filed 1989·Granted Oct 2, 1990·10 cites·2 claims
- 1844US7206980B2Integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 17, 2007·2 cites·23 claims
- 1943US6900626B2Voltage generator arrangementINFINEON TECHNOLOGIES AG·Filed 2003·Granted May 31, 2005·4 cites·10 claims
- 2040US6999355B2Circuit arrangement and method for setting a voltage supply for a read/write amplifier of an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Feb 14, 2006·3 cites·4 claims
- 2139US6992498B2Test apparatus for testing integrated modules and method for operating a test apparatusINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jan 31, 2006·2 cites·18 claims
- 2238US7251772B2Circuit arrangement having a number of integrated circuit components on a carrier substrate and method for testing a circuit arrangement of this typeINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 31, 2007·2 cites·10 claims
- 2338US7181579B2Integrated memory having redundant units of memory cells and method for testing an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Feb 20, 2007·2 cites·7 claims
- 2437US7263633B2Integrated circuit, in particular integrated memory, and methods for operating an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 28, 2007·2 cites·15 claims
- 2537US6917549B2Integrated memory and method for operating itINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 12, 2005·2 cites·8 claims
- 2636US6859406B2Dynamic RAM semiconductor memory and method for operating the memoryINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 22, 2005·2 cites·6 claims
- 2736US2004199730A1Device and method for controlling one or more memory modulesFiled 2004·Application pending·0 cites
- 2835US2007247944A1Integrated Semiconductor Memory with Refreshing of Memory CellsQIMONDA AG·Filed 2007·Application pending·0 cites
- 2933US2004263216A1Integrated circuit having a voltage monitoring circuit and a method for monitoring an internal burn-in voltageFiled 2004·Application pending·0 cites
- 3031US7042773B2Integrated circuit for storing operating parametersINFINEON TECHNOLOGIES AG·Filed 2004·Granted May 9, 2006·0 cites·15 claims
- 3128US2004042289A1Integrated memory circuit with a storage element and method for reading error informationFiled 2003·Application pending·0 cites
- 3228US2004260934A1Memory chip having an integrated address scrambler unit and method for scrambling an address in an integrated memoryFiled 2004·Application pending·0 cites
- 3325US2002194559A1Method for test-writing to the cell array of a semiconductor memoryFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →