Inventor · disambiguated record
Maarten Rutgers
Also filed as: RUTGERS MAARTEN
8 granted patents·4 pending applications·22 citations·filing 2007–2024
80Inventor score
Files withSOMALOGIC OPERATING CO INC5ASYLUM RESEARCH CORP2OXFORD INSTR ASYLUM RES INC2OXFORD INSTR PLC1OXFORD INSTRUMENTS ASYLUM RES INC1
Top patents by PatentIndex Score
12 records- 0185US8370960B2Modular atomic force microscopeASYLUM RESEARCH CORP·Filed 2009·Granted Feb 5, 2013·14 cites·3 claims
- 0283US9581616B2Modular atomic force microscope with environmental controlsOXFORD INSTR ASYLUM RES INC·Filed 2015·Granted Feb 28, 2017·2 cites·22 claims
- 0377US9097737B2Modular atomic force microscope with environmental controlsOXFORD INSTR ASYLUM RES INC·Filed 2013·Granted Aug 4, 2015·3 cites·16 claims
- 0477US2025188522A1Methods of detecting a leak from a subarray of a microarray chipSOMALOGIC OPERATING CO INC·Filed 2024·Application pending·0 cites
- 0575US12134798B1Methods of detecting a leak from a subarray of a microarray chip, kits of components that facilitate leak detection, and microarray chips configured for leak detectionSOMALOGIC OPERATING CO INC·Filed 2023·Granted Nov 5, 2024·0 cites·19 claims
- 0674US12145154B1Assay array plateSOMALOGIC OPERATING CO INC·Filed 2024·Granted Nov 19, 2024·0 cites·16 claims
- 0771US2025222457A1Assay array plateSOMALOGIC OPERATING CO INC·Filed 2024·Application pending·0 cites
- 0867US12383878B1Systems and methods for monitoring orbital shaker healthSOMALOGIC OPERATING CO INC·Filed 2024·Granted Aug 12, 2025·0 cites·16 claims
- 0961US10416190B2Modular atomic force microscope with environmental controlsOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2017·Granted Sep 17, 2019·0 cites·15 claims
- 1055US2017254834A1Modular Atomic Force MicroscopeOXFORD INSTR PLC·Filed 2017·Application pending·0 cites
- 1154US7856665B2Apparatus and method for scanning capacitance microscopy and spectroscopyASYLUM RESEARCH CORP·Filed 2007·Granted Dec 21, 2010·3 cites·20 claims
- 1251US2014223612A1Modular Atomic Force MicroscopePROKSCH ROGER·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →