Inventor · disambiguated record
Maurits Schaar
Also filed as: SCHAAR MAURITS V D · SCHAAR MAURITS VAN DER
0 granted patents·5 pending applications·0 citations·filing 2004–2007
Files withASML NETHERLANDS BV5
Top patents by PatentIndex Score
5 records- 0151US2008144036A1Method of measurement, an inspection apparatus and a lithographic apparatusASML NETHERLANDS BV·Filed 2006·Application pending·0 cites
- 0247US2009073448A1Method of measuring the overlay error, an inspection apparatus and a lithographic apparatusASML NETHERLANDS BV·Filed 2007·Application pending·0 cites
- 0344US2006109463A1Latent overlay metrologyASML NETHERLANDS BV·Filed 2004·Application pending·0 cites
- 0443US2008036984A1Method and apparatus for angular-resolved spectroscopic lithography characterizationASML NETHERLANDS BV·Filed 2006·Application pending·0 cites
- 0539US2007190762A1Device manufacturing method and computer program productASML NETHERLANDS BV·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Maurits Schaar files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →