Inventor · disambiguated record
Marijke Scotuzzi
Also filed as: SCOTUZZI MARIJKE
1 granted patent·7 pending applications·0 citations·filing 2020–2024
10Inventor score
Files withASML NETHERLANDS BV8
Top patents by PatentIndex Score
8 records- 0157US2024339294A1Charged-particle optical apparatus and projection methodASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0257US2024339292A1Charged particle device, charged particle assessment apparatus, measuring method, and monitoring methodASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0357US2024331968A1Charged-particle apparatus, multi-device apparatus, method of using charged-particle apparatus and control methodASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0454US2023324318A1Charged particle tool, calibration method, inspection methodASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0551US2025385072A1Charged particle apparatusASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0650US2023298850A1Inspection method and inspection toolASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0747US12325911B2Method and apparatus for forming a patterned layer of materialASML NETHERLANDS BV·Filed 2020·Granted Jun 10, 2025·0 cites·17 claims
- 0843US2023280662A1Method of performing metrology, method of training a machine learning model, method of providing a layer comprising a two-dimensional material, metrology apparatusASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Marijke Scotuzzi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →