Inventor · disambiguated record
Makarand Shinde
Also filed as: SHINDE MAKARAND · SHINDE MAKARAND S
18 granted patents·2 pending applications·558 citations·filing 2001–2010
96Inventor score
Top patents by PatentIndex Score
20 records- 0198US6856150B2Probe card with coplanar daughter cardFORMFACTOR INC·Filed 2001·Granted Feb 15, 2005·132 cites·55 claims
- 0297US7285968B2Apparatus and method for managing thermally induced motion of a probe card assemblyFORMFACTOR INC·Filed 2005·Granted Oct 23, 2007·77 cites·33 claims
- 0393US7471094B2Method and apparatus for adjusting a multi-substrate probe structureFORMFACTOR INC·Filed 2005·Granted Dec 30, 2008·30 cites·19 claims
- 0493US7119564B2Method and system for compensating thermally induced motion of probe cardsFORMFACTOR INC·Filed 2005·Granted Oct 10, 2006·20 cites·28 claims
- 0593US7116119B2Probe card with coplanar daughter cardFORMFACTOR INC·Filed 2005·Granted Oct 3, 2006·38 cites·26 claims
- 0693US7071715B2Probe card configuration for low mechanical flexural strength electrical routing substratesFORMFACTOR INC·Filed 2004·Granted Jul 4, 2006·73 cites·12 claims
- 0792US7230437B2Mechanically reconfigurable vertical tester interface for IC probingFORMFACTOR INC·Filed 2004·Granted Jun 12, 2007·47 cites·19 claims
- 0892US6972578B2Method and system for compensating thermally induced motion of probe cardsFORMFACTOR INC·Filed 2002·Granted Dec 6, 2005·43 cites·14 claims
- 0990US7312618B2Method and system for compensating thermally induced motion of probe cardsFORMFACTOR INC·Filed 2006·Granted Dec 25, 2007·12 cites·9 claims
- 1089US7671614B2Apparatus and method for adjusting an orientation of probesFORMFACTOR INC·Filed 2005·Granted Mar 2, 2010·15 cites·17 claims
- 1189US7592821B2Apparatus and method for managing thermally induced motion of a probe card assemblyFORMFACTOR INC·Filed 2007·Granted Sep 22, 2009·11 cites·23 claims
- 1286US7071714B2Method and system for compensating for thermally induced motion of probe cardsFORMFACTOR INC·Filed 2001·Granted Jul 4, 2006·25 cites·32 claims
- 1382US7825674B2Probe card configuration for low mechanical flexural strength electrical routing substratesFORMFACTOR INC·Filed 2006·Granted Nov 2, 2010·7 cites·38 claims
- 1481US7560941B2Method and system for compensating thermally induced motion of probe cardsFORMFACTOR INC·Filed 2006·Granted Jul 14, 2009·8 cites·9 claims
- 1580US7659736B2Mechanically reconfigurable vertical tester interface for IC probingFORMFACTOR INC·Filed 2007·Granted Feb 9, 2010·8 cites·13 claims
- 1678US7692433B2Sawing tile corners on probe card substratesFORMFACTOR INC·Filed 2006·Granted Apr 6, 2010·7 cites·13 claims
- 1776US7642794B2Method and system for compensating thermally induced motion of probe cardsFORMFACTOR INC·Filed 2007·Granted Jan 5, 2010·3 cites·8 claims
- 1867US7845072B2Method and apparatus for adjusting a multi-substrate probe structureFORMFACTOR INC·Filed 2008·Granted Dec 7, 2010·2 cites·22 claims
- 1957US2010000080A1Apparatus and method for managing thermally induced motion of a probe card assemblyFORMFACTOR INC·Filed 2009·Application pending·0 cites
- 2034US2011082599A1Optimizing Utility Usage by Smart MonitoringSHINDE MAKARAND·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →