Inventor · disambiguated record
Mari Sugihara
Also filed as: SUGIHARA MARI
5 granted patents·3 pending applications·28 citations·filing 2004–2011
75Inventor score
Top patents by PatentIndex Score
8 records- 0189US7643137B2Defect inspection apparatus, defect inspection method and method of inspecting hole patternNIKON CORP·Filed 2005·Granted Jan 5, 2010·15 cites·8 claims
- 0277US8446578B2Defect inspection apparatus, defect inspection method and method of inspecting hole patternSUGIHARA MARI·Filed 2009·Granted May 21, 2013·5 cites·7 claims
- 0376US8199242B2Camera and image processing programSUGIHARA MARI·Filed 2007·Granted Jun 12, 2012·7 cites·22 claims
- 0460US8928768B2Image processing device and computer-readable computer program product containing image processing programSUGIHARA MARI·Filed 2011·Granted Jan 6, 2015·1 cites·12 claims
- 0545US2004239918A1Defect inspection apparatus, defect inspection method and method of inspecting hole patternNIKON CORP·Filed 2004·Application pending·0 cites
- 0642US8041148B2Recording medium storing image processing program and image processing methodNIKON CORP·Filed 2008·Granted Oct 18, 2011·0 cites·9 claims
- 0740US2006055784A1Imaging device having image color adjustment functionNIKON CORP·Filed 2005·Application pending·0 cites
- 0828US2010260438A1Image processing apparatus and medium storing image processing programNIKON CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →