Inventor · disambiguated record
Masahiro Tadokoro
Also filed as: TADOKORO MASAHIRO
35 granted patents·2 pending applications·1,538 citations·filing 1980–2021
98Inventor score
Files withHITACHI LTD17RENESAS TECH CORP5RENESAS ELECTRONICS CORP3SHINKO ELECTRIC CO LTD3TOKYO ELECTRON LTD3
Top patents by PatentIndex Score
37 records- 0197US6365894B2Electromagnet and magnetic field generating apparatusHITACHI LTD·Filed 2001·Granted Apr 2, 2002·146 cites·6 claims
- 0297US6236043B1Electromagnet and magnetic field generating apparatusHITACHI LTD·Filed 1998·Granted May 22, 2001·134 cites·8 claims
- 0396US7154108B2Particle therapy systemHITACHI LTD·Filed 2005·Granted Dec 26, 2006·180 cites·6 claims
- 0495US7692168B2Device and method for outputting charged particle beamHITACHI LTD·Filed 2007·Granted Apr 6, 2010·187 cites·39 claims
- 0594US5576602AMethod for extracting charged particle beam and small-sized accelerator for charged particle beamHITACHI LTD·Filed 1994·Granted Nov 19, 1996·122 cites·19 claims
- 0693US8092703B2Manufacturing method of semiconductor deviceISHIBASHI TAKEO·Filed 2007·Granted Jan 10, 2012·40 cites·18 claims
- 0791US8874385B2Radiation detector and verification technique of positioning accuracy for radiation detectorTAKAYANAGI TAISUKE·Filed 2011·Granted Oct 28, 2014·21 cites·13 claims
- 0891US7247869B2Particle therapy systemHITACHI LTD·Filed 2004·Granted Jul 24, 2007·183 cites·17 claims
- 0991US6316776B1Charged particle beam apparatus and method for operating the sameHITACHI LTD·Filed 1999·Granted Nov 13, 2001·293 cites·7 claims
- 1086US6506674B2Method of manufacturing a semiconductor integrated circuit deviceHITACHI LTD·Filed 2001·Granted Jan 14, 2003·37 cites·35 claims
- 1185US6479392B2Fabrication method for semiconductor integrated circuit devices and semiconductor integrated circuit deviceHITACHI LTD·Filed 2001·Granted Nov 12, 2002·30 cites·29 claims
- 1282US9188685B2Calibration method for radiation detector, and particle therapy systemHITACHI LTD·Filed 2013·Granted Nov 17, 2015·21 cites·20 claims
- 1379US7186578B2Thin sheet production method and thin sheet production deviceSHINKO ELECTRIC CO LTD·Filed 2003·Granted Mar 6, 2007·18 cites·19 claims
- 1475US9415241B2Charged particle beam irradiation systemHITACHI LTD·Filed 2015·Granted Aug 16, 2016·4 cites·5 claims
- 1574US5783914AParticle beam accelerator, and a method of operationHITACHI LTD·Filed 1997·Granted Jul 21, 1998·62 cites·24 claims
- 1673US6633072B2Fabrication method for semiconductor integrated circuit devices and semiconductor integrated circuit deviceHITACHI LTD·Filed 2001·Granted Oct 14, 2003·13 cites·4 claims
- 1769US6838388B2Fabrication method of semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2001·Granted Jan 4, 2005·13 cites·19 claims
- 1867US8253113B2Charged particle beam irradiation system and charged particle beam extraction methodNISHIUCHI HIDEAKI·Filed 2009·Granted Aug 28, 2012·10 cites·26 claims
- 1963US9044605B2Beam monitor system and particle beam irradiation systemHITACHI LTD·Filed 2014·Granted Jun 2, 2015·3 cites·8 claims
- 2062US8674319B2Beam monitor system and particle beam irradiation systemHITACHI LTD·Filed 2013·Granted Mar 18, 2014·3 cites·20 claims
- 2161US9162081B2Beam monitor system and particle beam irradiation systemHITACHI LTD·Filed 2014·Granted Oct 20, 2015·1 cites·10 claims
- 2259US10143436B2Particle therapy systemHITACHI LTD·Filed 2013·Granted Dec 4, 2018·2 cites·20 claims
- 2356US7833905B2Method of manufacturing a semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2009·Granted Nov 16, 2010·0 cites·18 claims
- 2454US11574814B2Substrate and substrate processing methodTOKYO ELECTRON LTD·Filed 2020·Granted Feb 7, 2023·0 cites·8 claims
- 2554US7595266B2Method of manufacturing a semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2008·Granted Sep 29, 2009·0 cites·35 claims
- 2653US7485477B2Thin plate manufacturing method and thin plate manufacturing apparatusSHARP KK·Filed 2006·Granted Feb 3, 2009·0 cites·29 claims
- 2752US8684151B2Raw material loading apparatus and pipe unit for raw material loading apparatusTADOKORO MASAHIRO·Filed 2012·Granted Apr 1, 2014·2 cites·11 claims
- 2851US7985678B2Method of manufacturing a semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2010·Granted Jul 26, 2011·0 cites·18 claims
- 2950US7402475B2Method of manufacturing a semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2005·Granted Jul 22, 2008·0 cites·19 claims
- 3050US2011250752A1Method of manufacturing a semiconductor integrated circuit deviceCHAKIHARA HIRAKU·Filed 2011·Application pending·0 cites
- 3149US7109126B2Method of manufacturing a semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2004·Granted Sep 19, 2006·2 cites·21 claims
- 3247US2022059361A1Etching method and plasma processing apparatusTOKYO ELECTRON LTD·Filed 2021·Application pending·0 cites
- 3346US11251049B2Etching method and plasma processing apparatusTOKYO ELECTRON LTD·Filed 2020·Granted Feb 15, 2022·0 cites·11 claims
- 3446US9502282B2Method of semiconductor manufacture utilizing layer arrangement to improve autofocusRENESAS ELECTRONICS CORP·Filed 2014·Granted Nov 22, 2016·0 cites·15 claims
- 3544US4375885AReverberatory furnaceSHINKO ELECTRIC CO LTD·Filed 1980·Granted Mar 8, 1983·5 cites·12 claims
- 3642US7375037B2Fabrication method for semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2003·Granted May 20, 2008·0 cites·29 claims
- 3732US4512801AApparatus for and method of desulfurizing and heating molten metalSHINKO ELECTRIC CO LTD·Filed 1983·Granted Apr 23, 1985·6 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →