Inventor · disambiguated record
Masaru Tsuto
Also filed as: TSUTO MASARU
18 granted patents·1 pending application·181 citations·filing 1996–2013
93Inventor score
Top patents by PatentIndex Score
19 records- 0192US9262376B2Test apparatus and test methodTSUTO MASARU·Filed 2013·Granted Feb 16, 2016·41 cites·4 claims
- 0282US8666691B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2011·Granted Mar 4, 2014·8 cites·20 claims
- 0375US8362791B2Test apparatus additional module and test methodADVANTEST CORP·Filed 2009·Granted Jan 29, 2013·8 cites·18 claims
- 0474US6769083B1Test pattern generator, a testing device, and a method of generating a plurality of test patternsADVANTEST CORP·Filed 1999·Granted Jul 27, 2004·35 cites·11 claims
- 0568US6484282B1Test pattern generator, a memory testing device, and a method of generating a plurality of test patternsADVANTEST CORP·Filed 1999·Granted Nov 19, 2002·27 cites·66 claims
- 0666US8059547B2Test apparatus and test methodGOISHI MASARU·Filed 2008·Granted Nov 15, 2011·4 cites·10 claims
- 0766US6499126B1Pattern generator and electric part testing apparatusADVANTEST CORP·Filed 2000·Granted Dec 24, 2002·13 cites·17 claims
- 0861US8149721B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2009·Granted Apr 3, 2012·2 cites·6 claims
- 0956US6678852B2Semiconductor device testing apparatusADVANTEST CORP·Filed 2001·Granted Jan 13, 2004·7 cites·5 claims
- 1056US6601204B1Pattern generating method, pattern generator using the method, and memory tester using the pattern generatorADVANTEST CORP·Filed 2000·Granted Jul 29, 2003·10 cites·10 claims
- 1150US8165027B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2009·Granted Apr 24, 2012·0 cites·17 claims
- 1248US8483073B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2009·Granted Jul 9, 2013·0 cites·13 claims
- 1348US6363022B2Semiconductor memory device testerADVANTEST CORP·Filed 2001·Granted Mar 26, 2002·6 cites·4 claims
- 1445US6138259ASemiconductor memory testing apparatusADVANTEST CORP·Filed 1997·Granted Oct 24, 2000·10 cites·19 claims
- 1544US8692566B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2011·Granted Apr 8, 2014·0 cites·16 claims
- 1641US8743702B2Test apparatus and test methodISHIKAWA SHINICHI·Filed 2010·Granted Jun 3, 2014·0 cites·8 claims
- 1741US6032275ATest pattern generatorADVANTEST CORP·Filed 1998·Granted Feb 29, 2000·9 cites·8 claims
- 1837US2012136603A1Test apparatus and debug methodISHIKAWA SHINICHI·Filed 2011·Application pending·0 cites
- 1930US5850402ATest pattern generatorADVANTEST CORP·Filed 1996·Granted Dec 15, 1998·1 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →