Inventor · disambiguated record
Marek Un{Hacek Over (C)}Ovský
Also filed as: Un{hacek over (c)}ovský Marek
3 granted patents·9 citations·filing 2015–2019
56Inventor score
Files withFEI CO3
Top patents by PatentIndex Score
3 records- 0187US9618463B2Method of acquiring EBSP patternsFEI CO·Filed 2015·Granted Apr 11, 2017·9 cites·20 claims
- 0248US10790113B2Multi-beam charged particle imaging apparatusFEI CO·Filed 2019·Granted Sep 29, 2020·0 cites·15 claims
- 0339US9958403B1Arrangement for X-Ray tomographyFEI CO·Filed 2017·Granted May 1, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →