Inventor · disambiguated record
Marshall D. Wilson
Also filed as: WILSON MARSHALL · WILSON MARSHALL D
15 granted patents·685 citations·filing 1997–2024
94Inventor score
Files withSEMICONDUCTOR DIAGNOSTICS INC6SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD4WILSON MARSHALL2LAGOWSKI JACEK1SEMICONDUCTOR PHYSICS LAB CO LTD1
Top patents by PatentIndex Score
15 records- 0197US7188513B2Detecting concealed security threatsWILSON MARSHALL·Filed 2005·Granted Mar 13, 2007·115 cites·18 claims
- 0296US6680621B2Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage currentSEMICONDUCTOR DIAGNOSTICS INC·Filed 2001·Granted Jan 20, 2004·133 cites·62 claims
- 0396US6597193B2Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage currentSEMICONDUCTOR DIAGNOSTICS INC·Filed 2001·Granted Jul 22, 2003·129 cites·27 claims
- 0492US6569691B1Measurement of different mobile ion concentrations in the oxide layer of a semiconductor waferSEMICONDUCTOR DIAGNOSTICS INC·Filed 2000·Granted May 27, 2003·72 cites·35 claims
- 0590US6037797AMeasurement of the interface trap charge in an oxide semiconductor layer interfaceSEMICONDUCTOR DIAGNOSTICS INC·Filed 1997·Granted Mar 14, 2000·85 cites·20 claims
- 0689US12027430B1Semiconductor doping characterization method using photoneutralization time constant of corona surface chargeSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2023·Granted Jul 2, 2024·1 cites·20 claims
- 0788US7100424B2Apparatus for accessing container security threats and method of useWILSON MARSHALL·Filed 2004·Granted Sep 5, 2006·33 cites·17 claims
- 0888US6538462B1Method for measuring stress induced leakage current and gate dielectric integrity using corona dischargeSEMICONDUCTOR DIAGNOSTICS INC·Filed 1999·Granted Mar 25, 2003·95 cites·30 claims
- 0985US10969370B2Measuring semiconductor doping using constant surface potential corona chargingSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2015·Granted Apr 6, 2021·5 cites·18 claims
- 1078US9685906B2Photoluminescence mapping of passivation defects for silicon photovoltaicsSemilab SDI LLC·Filed 2014·Granted Jun 20, 2017·5 cites·15 claims
- 1173US12154833B2Semiconductor doping characterization method using photoneutralization time constant of corona surface chargeSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2024·Granted Nov 26, 2024·0 cites·24 claims
- 1270US8912799B2Accurate measurement of excess carrier lifetime using carrier decay methodSEMICONDUCTOR PHYSICS LAB CO LTD·Filed 2012·Granted Dec 16, 2014·3 cites·14 claims
- 1367US6815974B1Determining composition of mixed dielectricsSEMICONDUCTOR DIAGNOSTICS INC·Filed 2003·Granted Nov 9, 2004·7 cites·24 claims
- 1459US8093920B2Accurate measuring of long steady state minority carrier diffusion lengthsLAGOWSKI JACEK·Filed 2009·Granted Jan 10, 2012·2 cites·17 claims
- 1552US11561254B2Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substratesSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2021·Granted Jan 24, 2023·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →