Inventor · disambiguated record
Masami Yakabe
Also filed as: YAKABE MASAMI
19 granted patents·10 pending applications·122 citations·filing 2001–2011
93Inventor score
Top patents by PatentIndex Score
29 records- 0177US7557590B2Capacitance detection circuit and capacitance detection methodTOKYO ELECTRON LTD·Filed 2004·Granted Jul 7, 2009·21 cites·14 claims
- 0277US7383732B2Device for inspecting micro structure, method for inspecting micro structure and program for inspecting micro structureOCTEC INC·Filed 2005·Granted Jun 10, 2008·11 cites·30 claims
- 0375US6756790B2Impedance detection circuit, impedance detection device, and impedance detection methodTOKYO ELECTRON LTD·Filed 2001·Granted Jun 29, 2004·19 cites·29 claims
- 0473US7348788B2Probing card and inspection apparatus for microstructureTOKYO ELECTRON LTD·Filed 2006·Granted Mar 25, 2008·7 cites·25 claims
- 0572US8141426B2Displacement measurement apparatus for microstructure and displcement measurement method thereofIKEUCHI NAOKI·Filed 2008·Granted Mar 27, 2012·10 cites·16 claims
- 0671US7726190B2Device, method and program for inspecting microstructureTOKYO ELECTRON LTD·Filed 2006·Granted Jun 1, 2010·7 cites·12 claims
- 0765US7866038B2Through substrate, interposer and manufacturing method of through substrateTOKYO ELECTRON LTD·Filed 2005·Granted Jan 11, 2011·3 cites·2 claims
- 0863US7088112B2Sensor capacity sensing apparatus and sensor capacity sensing methodTOKYO ELECTRON LTD·Filed 2002·Granted Aug 8, 2006·9 cites·11 claims
- 0962US7994443B2Switch arrayTOKYO ELECTRON LTD·Filed 2006·Granted Aug 9, 2011·3 cites·18 claims
- 1061US7005865B2Circuit and method for impedance detectionTOKYO ELECTRON LTD·Filed 2002·Granted Feb 28, 2006·8 cites·15 claims
- 1160US7891090B2Method for manufacturing an interposerTOKYO ELECTRON LTD·Filed 2006·Granted Feb 22, 2011·2 cites·5 claims
- 1260US6633247B2Logarithmic a/d converter, method of logarithmic a/d conversion logarithmic d/a converter, method of logarithmic d/a conversion, and system for measuring physical quantitySUMITOMO METAL IND·Filed 2001·Granted Oct 14, 2003·9 cites·15 claims
- 1358US7019540B2Electrostatic capacitance detection circuit and microphone deviceTOKYO ELECTRON LTD·Filed 2002·Granted Mar 28, 2006·8 cites·9 claims
- 1451US7034551B2Electrostatic capacitance detection circuit and microphone deviceTOKYO ELECTRON LTD·Filed 2002·Granted Apr 25, 2006·2 cites·9 claims
- 1550US8130593B2Pressure wave generator and temperature controlling method thereofHAYASHI MASATO·Filed 2007·Granted Mar 6, 2012·0 cites·13 claims
- 1648US2011109338A1Interposer, probe card and method for manufacturing the interposerTOKYO ELECTRON LTD·Filed 2011·Application pending·0 cites
- 1748US2008223136A1Minute structure inspection device, inspection method, and inspection programTOKYO ELECTRON LTD·Filed 2008·Application pending·0 cites
- 1846US2012085655A1Interposer and manufacturing method for the sameKAGAWA KENICHI·Filed 2011·Application pending·0 cites
- 1945US7023223B2Impedance measuring circuit and capacitance measuring circuitTOKYO ELECTRON LTD·Filed 2002·Granted Apr 4, 2006·2 cites·6 claims
- 2044US2007193358A1Capacity detection type sensor elementKAGAWA KENICHI·Filed 2005·Application pending·0 cites
- 2144US2008067073A1Interposer And Manufacturing Method For The SameKAGAWA KENICHI·Filed 2005·Application pending·0 cites
- 2244US2008302185A1Microstructure Inspecting Apparatus and Microstructure Inspecting MethodYAKABE MASAMI·Filed 2005·Application pending·0 cites
- 2342US7368920B2Potential fixing device and potential fixing methodTOKYO ELECTRON LTD·Filed 2002·Granted May 6, 2008·1 cites·7 claims
- 2441US2009128171A1Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer ProgramOKUMURA KATSUYA·Filed 2006·Application pending·0 cites
- 2540US2009039908A1Microstructure inspecting apparatus and microstructure inspecting methodTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 2639US2007278650A1Semiconductor DeviceKAGAWA KENICHI·Filed 2005·Application pending·0 cites
- 2737US6900751B2Logarithmic digital to analog converter having multipliers coupled to reference voltagesTOKYO ELECTRON LTD·Filed 2003·Granted May 31, 2005·0 cites·11 claims
- 2836US2007257692A1ProbeYAKABE MASAMI·Filed 2005·Application pending·0 cites
- 2935US7046016B2Potential fixing device, potential fixing method, and capacitance measuring instrumentHOKUTO ELECTRONICS INC·Filed 2002·Granted May 16, 2006·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →