Inventor · disambiguated record
Masuhiro Yamada
Also filed as: YAMADA MASUHIRO
5 granted patents·95 citations·filing 1995–2008
82Inventor score
Files withADVANTEST CORP5
Top patents by PatentIndex Score
5 records- 0172US7441166B2Testing apparatus and testing methodADVANTEST CORP·Filed 2006·Granted Oct 21, 2008·9 cites·15 claims
- 0271US5495197AVariable delay circuitADVANTEST CORP·Filed 1995·Granted Feb 27, 1996·23 cites·2 claims
- 0364US5764093AVariable delay circuitADVANTEST CORP·Filed 1997·Granted Jun 9, 1998·21 cites·7 claims
- 0463US7782064B2Test apparatus and test moduleADVANTEST CORP·Filed 2008·Granted Aug 24, 2010·4 cites·12 claims
- 0557US6047393AMemory testing apparatusADVANTEST CORP·Filed 1998·Granted Apr 4, 2000·38 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →