Inventor · disambiguated record
Mei-Ling Chao
Also filed as: CHAO MEI-LING
16 granted patents·4 pending applications·86 citations·filing 2004–2024
90Inventor score
Top patents by PatentIndex Score
20 records- 0193US9691752B1Semiconductor device for electrostatic discharge protection and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jun 27, 2017·11 cites·20 claims
- 0292US8604548B2Semiconductor device having ESD deviceWANG CHANG-TZU·Filed 2011·Granted Dec 10, 2013·14 cites·10 claims
- 0390US7655980B1Device for ESD protection circuitUNITED MICROELECTRONICS CORP·Filed 2008·Granted Feb 2, 2010·21 cites·15 claims
- 0488US7372168B2Semiconductor chip capable of implementing wire bonding over active circuitsUNITED MICROELECTRONICS CORP·Filed 2006·Granted May 13, 2008·15 cites·29 claims
- 0579US7071575B2Semiconductor chip capable of implementing wire bonding over active circuitsUNITED MICROELECTRONICS CORP·Filed 2004·Granted Jul 4, 2006·22 cites·27 claims
- 0674US2025120185A1Electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0766US9607977B1Electrostatic discharge protection device and method for producing an electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2015·Granted Mar 28, 2017·1 cites·29 claims
- 0865US12211833B2Electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2022·Granted Jan 28, 2025·0 cites·19 claims
- 0961US8723263B2Electrostatic discharge protection deviceCHAO MEI-LING·Filed 2012·Granted May 13, 2014·2 cites·14 claims
- 1055US8748278B2Method for fabricating semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jun 10, 2014·0 cites·6 claims
- 1155US2024162218A1Electrostatic discharge protection device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 1253US2025072042A1Electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 1353US2024194668A1Electrostatic discharge protection structureUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 1451US12408408B2Electrostatic discharge protection device including source silicide pattern and drain silicide patternUNITED MICROELECTRONICS CORP·Filed 2022·Granted Sep 2, 2025·0 cites·14 claims
- 1547US9496251B2Electrostatic discharge protectorUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 15, 2016·0 cites·7 claims
- 1646US10366978B1Grounded gate NMOS transistor having source pulled back regionUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jul 30, 2019·0 cites·8 claims
- 1744US10062751B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Aug 28, 2018·0 cites·13 claims
- 1841US10090291B2Electrostatic discharge protection semiconductor device and layout structure of ESD protection semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Oct 2, 2018·0 cites·16 claims
- 1937US9691754B2Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jun 27, 2017·0 cites·15 claims
- 2033US10163895B2Electrostatic discharge protection deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Dec 25, 2018·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →