Inventor · disambiguated record
Melvin Khoo
Also filed as: KHOO MELVIN · KHOO MELVIN B
11 granted patents·150 citations·filing 2004–2010
90Inventor score
Top patents by PatentIndex Score
11 records- 0192US7271022B2Process for forming microstructuresTOUCHDOWN TECHNOLOGIES INC·Filed 2005·Granted Sep 18, 2007·33 cites·31 claims
- 0292US7245135B2Post and tip design for a probe contactTOUCHDOWN TECHNOLOGIES INC·Filed 2005·Granted Jul 17, 2007·23 cites·26 claims
- 0390US7264984B2Process for forming MEMSTOUCHDOWN TECHNOLOGIES INC·Filed 2004·Granted Sep 4, 2007·60 cites·36 claims
- 0480US7589542B2Hybrid probe for testing semiconductor devicesTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted Sep 15, 2009·9 cites·28 claims
- 0579US7362119B2Torsion spring probe contactor designTOUCHDOWN TECHNOLOGIES INC·Filed 2005·Granted Apr 22, 2008·9 cites·46 claims
- 0674US8344748B2Probe for testing semiconductor devicesADVANTEST AMERICA INC·Filed 2010·Granted Jan 1, 2013·4 cites·36 claims
- 0774US8278956B2Probecard system and methodLOSEY MATT·Filed 2010·Granted Oct 2, 2012·6 cites·19 claims
- 0867US7724010B2Torsion spring probe contactor designTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted May 25, 2010·4 cites·21 claims
- 0950US7538567B2Probe card with balanced lateral forceTOUCHDOWN TECHNOLOGIES INC·Filed 2006·Granted May 26, 2009·2 cites·10 claims
- 1043US7922888B2Post and tip design for a probe contactTOUCHDOWN TECHNOLOGIES INC·Filed 2007·Granted Apr 12, 2011·0 cites·14 claims
- 1141US7772859B2Probe for testing semiconductor devices with features that increase stress toleranceTOUCHDOWN TECHNOLOGIES INC·Filed 2008·Granted Aug 10, 2010·0 cites·29 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →