Inventor · disambiguated record
Megumi Takemoto
Also filed as: TAKEMOTO MEGUMI
13 granted patents·1 pending application·240 citations·filing 1998–2025
92Inventor score
Files withMITSUBISHI ELECTRIC CORP10PANASONIC IP MAN CO LTD2MITSUBISHI DENKI KABSUHIKI KAI1PANASONIC IP CORP AMERICA1
Top patents by PatentIndex Score
14 records- 0194US6741086B2Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatusMITSUBISHI ELECTRIC CORP·Filed 2002·Granted May 25, 2004·50 cites·15 claims
- 0289US6633176B2Semiconductor device test probe having improved tip portion and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 14, 2003·47 cites·7 claims
- 0386US7276923B2Semiconductor device test probeMITSUBISHI ELECTRIC CORP·Filed 2005·Granted Oct 2, 2007·12 cites·4 claims
- 0483US6646455B2Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matterMITSUBISHI DENKI KABSUHIKI KAI·Filed 1998·Granted Nov 11, 2003·52 cites·14 claims
- 0582US7274195B2Semiconductor device test probeMITSUBISHI ELECTRIC CORP·Filed 2003·Granted Sep 25, 2007·26 cites·4 claims
- 0682US6888344B2Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matterMITSUBISHI ELECTRIC CORP·Filed 2002·Granted May 3, 2005·24 cites·5 claims
- 0763US7825677B2Test jig for testing a packaged high frequency semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2009·Granted Nov 2, 2010·4 cites·7 claims
- 0861US6628127B2Probe card for testing semiconductor integrated circuit and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 30, 2003·9 cites·12 claims
- 0959US6885204B2Probe card, and testing apparatus having the sameMITSUBISHI ELECTRIC CORP·Filed 2003·Granted Apr 26, 2005·7 cites·2 claims
- 1056US6667626B2Probe card, and testing apparatus having the sameMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Dec 23, 2003·6 cites·4 claims
- 1154US2024205044A1Function restriction method, function restriction apparatus and non-transitory computer readable storage mediumPANASONIC IP CORP AMERICA·Filed 2024·Application pending·0 cites
- 1241USD1107940SCell culture apparatusPANASONIC IP MAN CO LTD·Filed 2025·Granted Dec 30, 2025·0 cites·1 claims
- 1341USD1107248SCell culture apparatusPANASONIC IP MAN CO LTD·Filed 2025·Granted Dec 23, 2025·0 cites·1 claims
- 1433US5972069AMetallic material made from tungsten or molybdenum, method of producing the metallic material, and secondary product material using the metallic materialMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 26, 1999·3 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →