Inventor · disambiguated record

Meng-Che Wu

Also filed as: WU MENG-CHE

2 granted patents·15 citations·filing 2012–2015

53Inventor score

Technology areasG06T

Files withKLA TENCOR CORP2

Top patents by PatentIndex Score

2 records

0189US9189844B2Detecting defects on a wafer using defect-specific informationKLA TENCOR CORP·Filed 2012·Granted Nov 17, 2015·15 cites·68 claims
0249US9721337B2Detecting defects on a wafer using defect-specific informationKLA TENCOR CORP·Filed 2015·Granted Aug 1, 2017·0 cites·23 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →