Inventor · disambiguated record
Michael Abraham
Also filed as: ABRAHAM MICHAEL · ABRAHAM MICHAEL A
10 granted patents·1 pending application·199 citations·filing 1998–2003
90Inventor score
Top patents by PatentIndex Score
11 records- 0186US6420864B1Modular substrate measurement systemNANOPHOTONICS AG·Filed 2000·Granted Jul 16, 2002·43 cites·10 claims
- 0278US6954267B2Device for measuring surface defectsNANOPHOTONICS AG·Filed 2002·Granted Oct 11, 2005·15 cites·18 claims
- 0377US6275291B1Micropolarimeter and ellipsometerNANOPHOTONICS AG·Filed 1999·Granted Aug 14, 2001·52 cites·15 claims
- 0469US6798513B2Measuring moduleNANOPHOTONICS AG·Filed 2002·Granted Sep 28, 2004·14 cites·2 claims
- 0568US6091499AMethod and device for automatic relative adjustment of samples in relation to an ellipsometerNANOPHOTONICS AG·Filed 1999·Granted Jul 18, 2000·44 cites·7 claims
- 0660US6935201B2Measurement configuration including a vehicle and method for performing measurements with the measurement configuration at various locationsNANOPHOTONICS AG·Filed 2003·Granted Aug 30, 2005·8 cites·22 claims
- 0751US6045064AUnder-vehicle spray deviceFiled 1998·Granted Apr 4, 2000·20 cites·5 claims
- 0845US6891609B2Measurement box with module for measuring wafer characteristicsNANOPHOTONICS AG·Filed 2002·Granted May 10, 2005·1 cites·12 claims
- 0944US7030401B2Modular substrate measurement systemRECIF SA·Filed 2001·Granted Apr 18, 2006·1 cites·11 claims
- 1041US6734969B2Vacuum measurement deviceNANOPHOTONICS AG·Filed 2001·Granted May 11, 2004·1 cites·18 claims
- 1128US2003196343A1Measurement moduleFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →