Inventor · disambiguated record
Michael Andres
Also filed as: ANDRES MICHAEL · ANDRES MICHAEL W
18 granted patents·66 citations·filing 2013–2020
91Inventor score
Top patents by PatentIndex Score
18 records- 0196US9274141B1Low resistance low wear test pin for test contactorJOHNSTECH INT CORP·Filed 2013·Granted Mar 1, 2016·15 cites·15 claims
- 0295US10725069B1Integrated circuit contactor for testing ICs and method of constructionJOHNSTECH INT CORP·Filed 2018·Granted Jul 28, 2020·13 cites·16 claims
- 0392US9429591B1On-center electrically conductive pins for integrated testingJOHNSTECH INT CORP·Filed 2014·Granted Aug 30, 2016·9 cites·11 claims
- 0488US10114039B1Selectively geometric shaped contact pin for electronic component testing and method of fabricationJOHNSTECH INT CORP·Filed 2016·Granted Oct 30, 2018·10 cites·10 claims
- 0586US10551412B2Low resistance low wear test pin for test contactorJOHNSTECH INT CORP·Filed 2017·Granted Feb 4, 2020·2 cites·8 claims
- 0676US9341649B1On-center electrically conductive pins for integrated testingJOHNSTECH INT CORP·Filed 2014·Granted May 17, 2016·3 cites·6 claims
- 0769US9638714B2On-center electrically conductive pins for integrated testingJOHNSTECH INT CORP·Filed 2014·Granted May 2, 2017·2 cites·14 claims
- 0866US11709183B2Self flattening test socket with anti-bowing and elastomer retentionJOHNSTECH INT CORP·Filed 2020·Granted Jul 25, 2023·0 cites·15 claims
- 0966US11209458B2Integrated circuit contactor for testing ICs and method of constructionJOHNSTECH INT CORP·Filed 2020·Granted Dec 28, 2021·0 cites·15 claims
- 1066US11183783B2High isolation contactor with test pin and housing for integrated circuit testingJOHNSTECH INT CORP·Filed 2020·Granted Nov 23, 2021·0 cites·20 claims
- 1160US11029335B1Selectively geometric shaped contact pin for electronic component testing and method of fabricationJOHNSTECH INT CORP·Filed 2018·Granted Jun 8, 2021·0 cites·10 claims
- 1260US9696347B2Testing apparatus and method for microcircuit and wafer level IC testingJOHNSTECH INT CORP·Filed 2014·Granted Jul 4, 2017·2 cites·13 claims
- 1360USD719923SArticulating contact pinJOHNSON DAVID·Filed 2014·Granted Dec 23, 2014·10 cites·1 claims
- 1458US10401386B2On-center electrically conductive pins for integrated testingJOHNSTECH INT CORP·Filed 2016·Granted Sep 3, 2019·0 cites·8 claims
- 1556US10928423B2Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin ringsJOHNSTECH INT CORP·Filed 2018·Granted Feb 23, 2021·0 cites·24 claims
- 1656US9804194B2Low resistance low wear test pin for test contactorJOHNSTECH INT CORP·Filed 2016·Granted Oct 31, 2017·0 cites·16 claims
- 1751US10067164B2Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin ringsJOHNSTECH INT CORP·Filed 2016·Granted Sep 4, 2018·0 cites·16 claims
- 1850US10686269B2High isolation contactor with test pin and housing for integrated circuit testingJOHNSTECH INT CORP·Filed 2018·Granted Jun 16, 2020·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →